公开(公告)号：US12224167B2

公开(公告)日：2025-02-11

申请号：US18497323

申请日：2023-10-30

Applicant: ADAPTAS SOLUTIONS PTY LTD

Inventor： Russell Jurek ,  Kevin Hunter

IPC: H01J43/18 ,  H01J43/10 ,  H01J43/28 ,  H01J47/00 ,  H01J49/02 ,  H01J49/28

Abstract: Components of scientific analytical equipment. More particularly, ion detectors of the type which incorporate electron multipliers and modifications thereto for extending the operational lifetime or otherwise improving performance. The ion detector may be embodied in the form of a particle detector having one or more electron emissive surfaces and/or an electron collector surface therein, the particle detector being configured such that in operation the environment about the electron emissive surface(s) and/or the electron collector surface is/are different to the environment immediately external to the detector.

公开(公告)号：US11978616B2

公开(公告)日：2024-05-07

申请号：US17053192

申请日：2019-05-06

Applicant: ADAPTAS SOLUTIONS PTY LTD

Inventor： Russell Jurek ,  David Dellagiacoma ,  Kevin Hunter

IPC: H01J49/02 ,  H01J43/28 ,  H01J49/26

CPC classification number: H01J43/28 ,  H01J49/025 ,  H01J49/26

Abstract: Components of scientific analytical equipment, such as electron multipliers and modifications thereto, for extending the operational lifetime or otherwise improving performance by way of improved construction. A detector includes one or more electron emissive surfaces and one or more detector elements configured to define on one side an environment internal the detector and on the other side an environment external the detector. The one or more detector elements are configured to inhibit or prevent flow of a gas from the environment external the detector to the environment internal the detector. Such detectors may be used in a mass spectrometry instrument, for example.

公开(公告)号：US11948785B2

公开(公告)日：2024-04-02

申请号：US18041462

申请日：2021-08-10

Applicant: ADAPTAS SOLUTIONS PTY LTD

Inventor： Aditya Wakhle ,  Russell Jurek ,  Kevin Hunter

IPC: H01J43/22 ,  H01J43/12 ,  H01J43/24

CPC classification number: H01J43/22 ,  H01J43/12 ,  H01J43/24

Abstract: The present invention relates to electron multiplier apparatus of the type used in ion detectors. In one form, the invention is an electron multiplier having two or more electron emissive surfaces, each having a different composition so as to together limit or overcome an acute gain effect on the electron multiplier due to the exposure of the two or more electron emissive surfaces to water molecules. Alternatively, the multiplier may have a single electron emissive surface of mixed composition comprising a first composition component and a second composition component so as to together limit or overcome an acute gain effect on the electron multiplier due to the exposure of the electron emissive surface to water molecules.

公开(公告)号：US20210142992A1

公开(公告)日：2021-05-13

申请号：US17053192

申请日：2019-05-06

Applicant: ADAPTAS SOLUTIONS PTY LTD

Inventor： Russell Jurek ,  David Dellagiacoma ,  Kevin Hunter

IPC: H01J43/28 ,  H01J49/02 ,  H01J49/26

Abstract: Components of scientific analytical equipment, such as electron multipliers and modifications thereto, for extending the operational lifetime or otherwise improving performance by way of improved construction. A detector includes one or more electron emissive surfaces and one or more detector elements configured to define on one side an environment internal the detector and on the other side an environment external the detector. The one or more detector elements are configured to inhibit or prevent flow of a gas from the environment external the detector to the environment internal the detector. Such detectors may be used in a mass spectrometry instrument, for example.

公开(公告)号：US20240063004A1

公开(公告)日：2024-02-22

申请号：US18497323

申请日：2023-10-30

Applicant: ADAPTAS SOLUTIONS PTY LTD

Inventor： Russell Jurek ,  Kevin Hunter

IPC: H01J43/18 ,  H01J43/10 ,  H01J43/28 ,  H01J47/00 ,  H01J49/02 ,  H01J49/28

CPC classification number: H01J43/18 ,  H01J43/10 ,  H01J43/28 ,  H01J47/002 ,  H01J47/005 ,  H01J49/025 ,  H01J49/288

Abstract: Components of scientific analytical equipment. More particularly, ion detectors of the type which incorporate electron multipliers and modifications thereto for extending the operational lifetime or otherwise improving performance. The ion detector may be embodied in the form of a particle detector having one or more electron emissive surfaces and/or an electron collector surface therein, the particle detector being configured such that in operation the environment about the electron emissive surface(s) and/or the electron collector surface is/are different to the environment immediately external to the detector.

公开(公告)号：US20230298873A1

公开(公告)日：2023-09-21

申请号：US18041462

申请日：2021-08-10

Applicant: ADAPTAS SOLUTIONS PTY LTD

Inventor： Aditya Wakhle ,  Russell Jurek ,  Kevin Hunter

IPC: H01J43/22 ,  H01J43/24 ,  H01J43/12

CPC classification number: H01J43/22 ,  H01J43/24 ,  H01J43/12

Abstract: The present invention relates to electron multiplier apparatus of the type used in ion detectors. In one form, the invention is an electron multiplier having two or more electron emissive surfaces, each having a different composition so as to together limit or overcome an acute gain effect on the electron multiplier due to the exposure of the two or more electron emissive surfaces to water molecules. Alternatively, the multiplier may have a single electron emissive surface of mixed composition comprising a first composition component and a second composition component so as to together limit or overcome an acute gain effect on the electron multiplier due to the exposure of the electron emissive surface to water molecules.

公开(公告)号：US20230215712A1

公开(公告)日：2023-07-06

申请号：US18001155

申请日：2021-06-07

Applicant: ADAPTAS SOLUTIONS PTY LTD

Inventor： Russell Jurek ,  Toby Shanley

IPC: H01J43/14 ,  H01J43/02 ,  H01J49/02

CPC classification number: H01J43/14 ,  H01J43/02 ,  H01J49/025 ,  H01J49/40

Abstract: Scientific analytical equipment including apparatus and methods for detecting and quantitating particles, and particularly ions generated in the course of mass spectroscopy. In one version, a particle detection apparatus includes electron emissive surfaces which emit secondary electrons in response to impact with a particle, the apparatus maintaining spatial separation between: (i) secondary electrons emitted as a result of the impact of a first particle in a first region of the electron emissive surface; and (ii) secondary electrons emitted as a result of the impact of a second particle in a second region of the electron emissive surface.

公开(公告)号：US11410839B2

公开(公告)日：2022-08-09

申请号：US17282472

申请日：2019-08-26

Applicant: ADAPTAS SOLUTIONS PTY LTD

Inventor： Russell Jurek ,  Kevin Hunter

IPC: H01J43/28 ,  H01J43/10 ,  H01J43/18

Abstract: An electron multiplier apparatus of the type used in ion detectors, and modifications thereto for extending the operational lifetime or otherwise improving performance. The electron multiplier includes a series of discrete electron emissive surfaces configured to provide an electron amplification chain, the electron multiplier being configured so as to inhibit or prevent a contaminant from entering into, or passing partially through, or passing completely through the electron multiplier. The electron multiplier may include one or more baffles configured so as to decrease vacuum conductance of the electron multiplier compared to the same or similar electron multiplier not having one or more baffles.