公开(公告)号：US20250060319A1

公开(公告)日：2025-02-20

申请号：US18717860

申请日：2022-12-13

Applicant: 3M INNOVATIVE PROPERTIES COMPANY

Inventor： Steven P. Floeder ,  Katherine E. Struthers ,  Taylor E. Hoensheid ,  Jeffrey P. Adolf

IPC: G01N21/89 ,  G01N21/88 ,  G01N21/892

Abstract: Systems and techniques are described for detecting surface profile defects within a moving web. An example system includes a conveyor configured to translate the web, along a downweb direction and at a translation speed, relative to an inspection area; a point light source configured to emit light, wherein the point light source is positioned and oriented relative to the conveyor to illuminate a portion of the web positioned within the inspection area; a diffusing screen positioned and oriented relative to the conveyor to receive the light reflected from the web as the web is translated through the inspection area; an image capture device configured to capture images of the diffusing screen; and a computing device configured to: identify, based on the images, a surface profile defect in a surface of web; and output data indicating a relative location of the defect within the web.

公开(公告)号：US20250036112A1

公开(公告)日：2025-01-30

申请号：US18917251

申请日：2024-10-16

Applicant: 3M INNOVATIVE PROPERTIES COMPANY

Inventor： Brian E. Brooks ,  Gilles J. Benoit ,  Peter O. Olson ,  Tyler W. Olson ,  Himanshu Nayar ,  Frederick J. Arsenault ,  Nicholas A. Johnson ,  Brett R. Hemes ,  Thomas J. Strey ,  Jonathan B. Arthur ,  Nathan J. Herbst ,  Aaron K. Nienaber ,  Sarah M. Mullins ,  Mark W. Orlando ,  Cory D. Sauer ,  Timothy J. Clemens ,  Scott L. Barnett ,  Zachary M. Schaeffer ,  Patrick G. Zimmerman ,  Gregory P. Moriarty ,  Jeffrey P. Adolf ,  Steven P. Floeder ,  Andreas Backes ,  Peter J. Schneider ,  Maureen A. Kavanagh ,  Glenn E. Casner ,  Miaoding Dai ,  Christopher M. Brown ,  Lori A. Sjolund ,  Jon A. Kirschhoffer ,  Carter C. Hughes

IPC: G05B19/418 ,  B25J11/00

Abstract: Methods, systems, and apparatus, including computer programs encoded on a computer storage medium, for optimizing a process of manufacturing a product. In one aspect, the method comprises repeatedly performing the following: i) selecting a configuration of input settings for manufacturing a product, based on a causal model that measures causal relationships between input settings and a measure of a quality of the product; ii) determining the measure of the quality of the product manufactured using the configuration of input settings; and iii) adjusting, based on the measure of the quality of the product manufactured using the configuration of input settings, the causal model.

公开(公告)号：US12140938B2

公开(公告)日：2024-11-12

申请号：US17436886

申请日：2019-10-03

Applicant: 3M INNOVATIVE PROPERTIES COMPANY

Inventor： Brian E. Brooks ,  Gilles J. Benoit ,  Peter O. Olson ,  Tyler W. Olson ,  Himanshu Nayar ,  Frederick J. Arsenault ,  Nicholas A. Johnson ,  Brett R. Hemes ,  Thomas J. Strey ,  Jonathan B. Arthur ,  Nathan J. Herbst ,  Aaron K. Nienaber ,  Sarah M. Mullins ,  Mark W. Orlando ,  Cory D. Sauer ,  Timothy J. Clemens ,  Scott L. Barnett ,  Zachary M. Schaeffer ,  Patrick G. Zimmerman ,  Gregory P. Moriarty ,  Jeffrey P. Adolf ,  Steven P. Floeder ,  Andreas Backes ,  Peter J. Schneider ,  Maureen A. Kavanagh ,  Glenn E. Casner ,  Miaoding Dai ,  Christopher M. Brown ,  Lori A. Sjolund ,  Jon A. Kirschhoffer ,  Carter C. Hughes

IPC: G05B19/00 ,  B25J11/00 ,  G05B19/418

Abstract: Methods, systems, and apparatus, including computer programs encoded on a computer storage medium, for optimizing a process of manufacturing a product. In one aspect, the method comprises repeatedly performing the following: i) selecting a configuration of input settings for manufacturing a product, based on a causal model that measures causal relationships between input settings and a measure of a quality of the product; ii) determining the measure of the quality of the product manufactured using the configuration of input settings; and iii) adjusting, based on the measure of the quality of the product manufactured using the configuration of input settings, the causal model.

公开(公告)号：US20210323167A1

公开(公告)日：2021-10-21

申请号：US17270490

申请日：2019-08-21

Applicant: 3M INNOVATIVE PROPERTIES COMPANY

Inventor： Brett R. Hemes ,  John W. Henderson ,  Nathan J. Herbst ,  Steven P. Floeder ,  Jeffrey P. Adolf

IPC: B25J11/00 ,  B25J9/16 ,  B05D5/00 ,  G06N7/00

Abstract: A method and associated system for providing robotic paint repair includes receiving coordinates of identified defects in a substrate along with characteristics of the defects, and communicating the coordinates to a robot controller module along with additional data needed to control a robot manipulator to bring an end effector of the robot manipulator into close proximity to the identified defect on the substrate. The characteristics of the defect and current state of at least the end effector is provided to a policy server that provides repair actions based on a previously learned control policy that is updated by a machine learning unit. The repair action is executed by communicating instructions for the repair action to the robot controller module and end effector.

公开(公告)号：US20210278347A1

公开(公告)日：2021-09-09

申请号：US16326635

申请日：2017-09-01

Applicant: 3M INNOVATIVE PROPERTIES COMPANY

Inventor： Steven P. Floeder ,  Nathaniel S. Rowekamp ,  Xin Yu ,  James A. Masterman ,  Ian A. Edhlund ,  Mark E. Flanzer ,  Scott P. Daniels ,  Matthew V. Rundquist ,  Jeffrey P. Adolf

IPC: G01N21/89 ,  G01N21/892 ,  G01N21/896

Abstract: Techniques are described for inspection of films in order to detect Machine Direction Line (“MDL”) defects. An example system comprises a light source configured to provide a source of light rays, directed to a film product so that the light rays are incident to a surface of the film product at a non-perpendicular angle of incidence. An image capturing device is configured to generate an image of the film product by capturing a level of light intensity of the light rays exiting the film product in a plurality of image areas, each image area representing a line imaged across the film product that is perpendicular to a direction of manufacture of the film product. An image processing device is configured to process the image of the film product to provide an indication of the detection of one or more machine direction line (MDL) defects in the film product.

公开(公告)号：US20210110563A1

公开(公告)日：2021-04-15

申请号：US17052706

申请日：2019-05-08

Applicant: 3M INNOVATIVE PROPERTIES COMPANY

Inventor： Raghunath Padiyath ,  Viruru Phaniraj ,  Jeffrey P. Adolf ,  Steven P. Floeder

IPC: G06T7/62 ,  G06T7/73 ,  H04Q9/00 ,  G01B11/03

Abstract: A system for measuring dimensions of film to be applied to a window includes a plurality of removable cards for placement on the window, each of the plurality of removable cards having a plurality of visible correspondence points at pre-defined positions on the respective removable card. The system further includes a mobile device having an image capture device, and the image capture device is configured to capture an image of the window having a set of correspondence points visible in the image. Additionally, the system includes a server configured to receive the image of the window captured by the mobile device and process the image to determine dimensions of a film to be cut for the window based on the set of correspondence points and the pre-defined positions, and processing the image removes perspective distortions in the image. The system is configured to output the dimensions of the film.