摘要:
A design supporting method includes partitioning a partition path of circuit information into partitioned paths based on a given condition, calculating a variation value of each of the partitioned paths based on variation values on a delay of a cell included in the corresponding partitioned path, calculating a partition propagation delay time of each of the partitioned paths based on the variation value of the corresponding partitioned path, and calculating a source propagation delay time of the source path by merging the propagation delay time of each of the partitioned paths.
摘要:
A non-transitory computer-readable recording medium stores therein a program that causes a processor to execute inputting a driving capability value, a lumped-constant capacitance value, and an input capacitance value included in the lumped-constant capacitance value, respectively defined in a circuit model, and further inputting a first delay time of the circuit model, based on the driving capability value and the lumped-constant capacitance value; setting in the circuit model, the driving capability value, the lumped-constant capacitance value, and the input capacitance value; acquiring a second delay time of the circuit model, by providing to a simulator, the circuit model having values set therein; calculating a relative evaluation value for the first delay time and the second delay time; and storing to a storage apparatus and as a delay time correcting coefficient, the relative evaluation value correlated with the driving capability value, the lumped-constant capacitance value, and the input capacitance value.
摘要:
A clock data recovery circuit includes a receiving circuit that takes in input data based on a sampling clock, a demultiplexer that converts serial data output from the receiving circuit into parallel data, a clock/data recovery part that detects phase information from the parallel data output from the demultiplexer and generates the sampling clock by adjusting the phase of a reference clock based on the phase information, a data pattern analyzer that carries out frequency analysis of the parallel data output from the demultiplexer, and an aliasing detector that detects a clock recovery state based on the analysis result of the frequency of the parallel data.
摘要:
A clock data recovery circuit includes a receiving circuit that takes in input data based on a sampling clock, a demultiplexer that converts serial data output from the receiving circuit into parallel data, a clock/data recovery part that detects phase information from the parallel data output from the demultiplexer and generates the sampling clock by adjusting the phase of a reference clock based on the phase information, a data pattern analyzer that carries out frequency analysis of the parallel data output from the demultiplexer, and an aliasing detector that detects a clock recovery state based on the analysis result of the frequency of the parallel data.
摘要:
A semiconductor device having a plurality of circuits with the same configuration, wherein since expected values in the number corresponding to the number of circuits are not required, operation tests are effectively performed in a short time. The semiconductor device has first, second and third digital filters with the same configuration. To test these digital filters, comparison circuits comparing an output value and an expected value are individually provided per one digital filter. The digital filters and the comparison circuits are daisy-chained such that the output values of the first and second digital filters are inputted as the expected values of the comparison circuits corresponding to the second and third digital filters, respectively. When the same test signal is inputted to each digital filter from a built-in self test (BIST) controller, occurrence of abnormal circuits can be detected based on comparison results of the comparison circuits.