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    Transfer printing machine for transferring printing on hockey stick
    11.
    发明授权
    Transfer printing machine for transferring printing on hockey stick 有权
    转印机用于在曲棍球棒上转印

    公开(公告)号：US08387527B2

    公开(公告)日：2013-03-05

    申请号：US12705627

    申请日：2010-02-14

    Applicant: Kuo-Cheng Huang

    Inventor： Kuo-Cheng Huang

    IPC: B41F17/16 ,  B41F17/24

    CPC classification number: B41M1/40 ,  B41F16/00 ,  B41F17/26

    Abstract: A transfer printing machine for hockey sticks include a base, a transmission unit connected to the lower portion of the base and five stations located on the top of the base. The five stations are located along the transmission direction of the transmission unit. The first station prints patterns on a top surface of a straight handle of the hockey sticks which are moved by the transmission unit. The second station prints patterns on a left side and a right side of the straight handle. The third station and the fourth station print patterns on a first inclined surface and a second inclined surface of the straight handle respectively. The fifth station prints patterns on a bottom surface of the straight handle of the hockey sticks.

    Abstract translation: 用于曲棍球的转印机包括基座，连接到基座的下部的传输单元和位于基座顶部的五个台。 五个站位于传输单元的传输方向。 第一站在由传动单元移动的曲棍球棒的直柄的顶表面上打印图案。 第二站在直柄的左侧和右侧打印图案。 第三站和第四站分别在直柄的第一倾斜表面和第二倾斜表面上打印图案。 第五站在曲棍球杆的直柄的底面打印图案。

    Lens measuring device and method applied therein
    13.
    发明授权
    Lens measuring device and method applied therein 有权
    镜片测量装置及其应用方法

    公开(公告)号：US07969563B2

    公开(公告)日：2011-06-28

    申请号：US12361911

    申请日：2009-01-29

    Applicant: Chien-Ching Ma ,  Ching-Yuan Chang ,  Kuo-Cheng Huang ,  Shih-Feng Tseng

    Inventor： Chien-Ching Ma ,  Ching-Yuan Chang ,  Kuo-Cheng Huang ,  Shih-Feng Tseng

    IPC: G01B9/00

    CPC classification number: G01M11/0257

    Abstract: A lens measuring device and method applied therein. The lens measuring device includes a light source, a first polarizer, a second polarizer, and an image analysis module. The method includes enabling the light source to orderly pass through the first polarizer, a lens to be measured, and the second polarizer to generate a light beam to be measured, and then enabling the image analysis module to analyze image-related information of the light beam to be measured, consequently deducing the structural center and energy distribution of the lens to be measured, and then further analyzing errors in polarity and skewness of the lens to be measured. By applying a common light source, the method is spared complicated correction that is otherwise required when a conventional collimating laser light source is applied, and the method can also easily and simultaneously test a plurality of lenses to be measured.

    Abstract translation: 应用于其中的透镜测量装置和方法。 透镜测量装置包括光源，第一偏振器，第二偏振器和图像分析模块。 该方法包括使光源有序地穿过第一偏振器，待测透镜和第二偏振器，以产生要测量的光束，然后使图像分析模块能够分析光的图像相关信息 从而推断要测量的透镜的结构中​​心和能量分布，然后进一步分析要测量的透镜的极性和偏度的误差。 通过应用公共光源，该方法避免了当应用传统的准直激光光源时另外需要的复杂校正，并且该方法还可以容易且同时地测试要测量的多个透镜。

    Method for cutting nonmetal material
    14.
    发明授权
    Method for cutting nonmetal material 有权
    切割非金属材料的方法

    公开(公告)号：US07880118B2

    公开(公告)日：2011-02-01

    申请号：US11649534

    申请日：2007-01-04

    Applicant: Yuan-Chieh Cheng ,  Kuo-Cheng Huang ,  Hui-Hsiung Lin ,  Wen-Hong Wu

    Inventor： Yuan-Chieh Cheng ,  Kuo-Cheng Huang ,  Hui-Hsiung Lin ,  Wen-Hong Wu

    IPC: B23K26/00

    CPC classification number: C03B33/09 ,  B23K26/40 ,  B23K2103/50 ,  B28D1/221 ,  C03B33/091 ,  C03B33/093 ,  Y10T225/12 ,  Y10T225/304

    Abstract: A method for cutting a nonmetal material is provided. The method includes steps of (a) generating a tension stress on a surface of the nonmetal material by exerting a bending stress thereon; (b) providing a thermal effect along a path direction on the surface, wherein the thermal effect grows along a direction opposite to the path direction; (c) providing a first cryogenic effect in a first incident direction along the path direction; and (d) providing a second cryogenic effect in a second incident direction along the path direction, wherein a crack along the path direction on the surface is formed as a result of the tension stress, the thermal effect, and the cryogenic effects therealong for cutting the nonmetal material.

    Abstract translation: 提供了切割非金属材料的方法。 该方法包括以下步骤：（a）通过在其上施加弯曲应力而在非金属材料的表面上产生拉伸应力; （b）沿着所述表面上的路径方向提供热效应，其中所述热效应沿着与所述路径方向相反的方向生长; （c）沿着路径方向在第一入射方向上提供第一低温效应; 和（d）沿着路径方向在第二入射方向上提供第二低温效应，其中由于拉伸应力，热效应和切割的低温效应，沿着路面方向的裂纹形成裂纹 非金属材料。

    CATADIOPTRIC TELESCOPE IMAGING SYSTEM
    17.
    发明申请
    CATADIOPTRIC TELESCOPE IMAGING SYSTEM 有权
    CATADIOPTRIC TELESCOPE成像系统

    公开(公告)号：US20080100912A1

    公开(公告)日：2008-05-01

    申请号：US11772473

    申请日：2007-07-02

    Applicant: Shih-Feng Tseng ,  Yu-Jen Lin ,  Kuo-Cheng Huang ,  Wen-Hong Wu ,  Feng-Chang Hsu

    Inventor： Shih-Feng Tseng ,  Yu-Jen Lin ,  Kuo-Cheng Huang ,  Wen-Hong Wu ,  Feng-Chang Hsu

    IPC: G02B23/00

    CPC classification number: G02B17/0896 ,  G02B17/0808 ,  G02B21/04

    Abstract: A telescope imaging system is provided. The telescope imaging system comprises a first lens group for receiving a spot light and generating a first refracted beam, a second lens group for receiving the first refracted beam and generating a second refracted beam, a third lens group having a convex lens disposed at a side of the third lens group distant from the spot light for receiving the second refracted beam and generating a parallel beam by an effective focus formed by the first lens group, the second lens group and the third lens group, a first reflective mirror having an opening, receiving the parallel beam and generating a reflected beam, and a second reflective mirror adjacent to the third group lens and reflecting the reflected beam for allowing the reflected beam passing through the opening and focused as an image.

    Abstract translation: 提供了望远镜成像系统。 望远镜成像系统包括用于接收点光并产生第一折射光束的第一透镜组，用于接收第一折射光束并产生第二折射光束的第二透镜组，具有设置在侧面的凸透镜的第三透镜组 远离用于接收第二折射光束的聚光的第三透镜组，并且由第一透镜组，第二透镜组和第三透镜组形成的有效焦点产生平行光束，具有开口的第一反射镜， 接收所述平行光束并产生反射光束，以及与所述第三组透镜相邻的第二反射镜，并且反射所述反射光束以允许反射光束通过所述开口并被聚焦成图像。

    Dynamic storage device and dynamic access management method
    18.
    发明授权
    Dynamic storage device and dynamic access management method 有权

    公开(公告)号：US11365053B2

    公开(公告)日：2022-06-21

    申请号：US16608845

    申请日：2018-10-25

    Applicant: Kuo-Cheng Huang

    Inventor： Kuo-Cheng Huang

    IPC: G06F7/00 ,  B65G1/137 ,  G06K7/10 ,  B65G13/02

    Abstract: A dynamic storage device includes a storage area, a power carrying and moving device, a carrier group, a carrier detection device, a power transmission device, a gate, a gate detection device, a temporary storage area and a temporary storage area detection device. The storage device further includes a central control system for commanding, controlling, instructing and managing the aforementioned components and managing the information returned from each component. A Radio Frequency Identification (RFID) technology is used to implement the dynamic storage device and the dynamic access management method. The RFID tag is labelled to the carrier instead of the object, and the targets managed by the storage device and dynamic access management method are the carrier and carrier group. Each carrier forming the carrier group records the detailed object information contained in the carrier by the RFID tag, so as to achieve the effects of managing the object.

    Inspection method for inspecting defects of wafer surface
    19.
    发明授权
    Inspection method for inspecting defects of wafer surface 有权
    检查晶圆表面缺陷的检查方法

    公开(公告)号：US08643836B1

    公开(公告)日：2014-02-04

    申请号：US13599479

    申请日：2012-08-30

    Applicant: Hsin-Yi Tsai ,  Kuo-Cheng Huang ,  Ya-Cheng Liu ,  Min-Wei Hung

    Inventor： Hsin-Yi Tsai ,  Kuo-Cheng Huang ,  Ya-Cheng Liu ,  Min-Wei Hung

    IPC: G01N21/00

    CPC classification number: G01N21/47 ,  G01N21/9501

    Abstract: The present invention provides an inspection method for inspecting defects of wafer surface. The method includes: encircling peripheral region of the wafer surface by a first light source set and a second light source set; using a control module to control the first light source set and the second light source set to irradiate the light alternately from different directions; using an image pick-up module to receive a scattered light image during each time when the first light source set or the second light source set irradiates the light on the wafer surface; and then using a process module to obtain an enhanced and clear defect image of wafer surface by processing each of the scattered light images.

    Abstract translation: 本发明提供了一种用于检查晶片表面缺陷的检查方法。 该方法包括：通过第一光源组和第二光源组环绕晶片表面的周边区域; 使用控制模块来控制第一光源组和第二光源组，以从不同方向交替地照射光; 使用图像拾取模块在第一光源组或第二光源组照射晶片表面上的光的每个时间期间接收散射光图像; 然后使用处理模块通过处理每个散射光图像来获得晶片表面的增强和清晰的缺陷图像。

    APPARATUS AND METHOD FOR PERFORMING PHOTODYNAMIC DIAGNOSIS AND PHOTODYNAMIC THERAPY
    20.
    发明申请
    APPARATUS AND METHOD FOR PERFORMING PHOTODYNAMIC DIAGNOSIS AND PHOTODYNAMIC THERAPY 审中-公开
    用于执行光动力诊断和光化学治疗的装置和方法

    公开(公告)号：US20130053699A1

    公开(公告)日：2013-02-28

    申请号：US13221145

    申请日：2011-08-30

    Applicant: Wen-Hong Wu ,  Chung-Hsing Chang ,  Han-Chao Chang ,  Chun-Li Chang ,  Kuo-Cheng Huang ,  Din-Ping Tsai ,  Hsin-Su Yu

    Inventor： Wen-Hong Wu ,  Chung-Hsing Chang ,  Han-Chao Chang ,  Chun-Li Chang ,  Kuo-Cheng Huang ,  Din-Ping Tsai ,  Hsin-Su Yu

    IPC: A61B6/00

    CPC classification number: A61B5/0071 ,  A61B5/7425 ,  A61N5/062

    Abstract: An apparatus for performing photodynamic diagnosis and photodynamic therapy on a target region that is pre-given with a photosensitizer precursor includes a display unit, an excitation light source operable to irradiate the target region with exciting light so as to excite emission of fluorescence from the target region as a result of fluorescence response of the photosensitizer precursor, an image capturing unit operable to capture a white light image and a fluorescent image of the target region, an image processing unit operable to superimpose the white light image and the fluorescent image into a synthesized image and to provide at least one of the white light image, the fluorescent image and the synthesized image thereto for display on the display unit, and a curing light source operable to irradiate a specified portion of the target region with curing light for treating the specified portion.

    Abstract translation: 用于对预先给予光敏剂前体的目标区进行光动力学诊断和光动力学治疗的装置包括显示单元，激发光源，其可操作以用激发光照射目标区域，以激发来自目标的荧光的发射 区域，作为光敏剂前体的荧光响应的结果，可操作以捕获白色光图像和目标区域的荧光图像的图像捕获单元，可操作以将白色光图像和荧光图像叠加到合成的区域中的图像处理单元 并且提供白光图像，荧光图像和合成图像中的至少一个以在显示单元上显示;以及固化光源，其可操作以用固化光照射目标区域的指定部分，以处理指定的 一部分。

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