Abstract:
There are provided a displaying method and a display terminal. The displaying method comprises: acquiring a usage mode of the display terminal (S1); and determining an effective use area of a display screen (1) in the display terminal according to the usage mode (S2). The displaying method and display terminal detect the usage mode of the display terminal in real time, and adjust the effective use area of the display screen in the display terminal according to the usage mode, so that the user's different requirements for the liquid crystal screen in different usage modes are satisfied, and thus the user experience is raised.
Abstract:
Embodiments of the present invention disclose an array substrate including: a flexible supporting base on which a plurality of rows of scanning lines and a plurality of columns of data lines are provided and are crossed to define a plurality of pixel units on the flexible supporting base. The flexible supporting base is further provided thereon with a plurality of rows of first signal lines and a plurality of columns of second signal lines, and conductor layers. Each of the conductor layers is located within one of at least some of the pixel units, is connected to a corresponding column of second signal line, and is configured for generating an electrical signal that is associated with a bent degree of the array substrate, and for outputting the electrical signal via the corresponding column of second signal line under driving of a signal from the first signal line. Meanwhile, a display panel and a method of detecting a bent degree of the same are disclosed.
Abstract:
The present disclosure relates to a sheet resistance measuring method, comprising the following steps: connecting at least one to-be-measured thin film having a predetermined shape to two separate electrodes in at least one pair of electrodes; measuring the resistance between the two electrodes in each pair of electrodes; and determining the sheet resistance of the to-be-measured thin film based on the measured resistance and the shape of the corresponding to-be-measured thin film.