Monitoring of resistance welding
    91.
    发明申请
    Monitoring of resistance welding 审中-公开
    电阻焊接监控

    公开(公告)号:US20030165180A1

    公开(公告)日:2003-09-04

    申请号:US10239905

    申请日:2003-02-07

    CPC classification number: B23K11/252 B23K2101/04

    Abstract: A method of monitoring the nugget size of the welds produced by a spot welding machine, comprises optically imaging a region of a weld spot onto a transducer (21) after completion of the spot welding process. The transducer (21) produces an electrical signal having avalue dependent on the mean intensity and the wavelength distribution of the radiation emitted from the region of the weld spot (18) imaged on to the transducer (21). A computer (24) analyses the electrical signal produced by the transducer (21) to evaluate a weld nugget size indicator value and issue a warning through a visual display module (31) when welds of poor size are being, or about to be produced, so that corrective action can be taken by replacing or dressing the electrodes.

    Abstract translation: 监测由点焊机产生的焊缝的熔核尺寸的方法包括在点焊过程完成之后将焊点的区域光学地成像到换能器(21)上。 换能器(21)产生取决于从成像在换能器(21)上的焊接点(18)的区域发射的辐射的平均强度和波长分布的电平(avalue)的电信号。 计算机(24)分析由换能器(21)产生的电信号以评估焊点尺寸指示器值,并且当小尺寸的焊缝正在或即将被生产时,通过视觉显示模块(31)发出警告, 从而可以通过更换或修整电极来采取纠正措施。

    Method for determining temperatures on semiconductor components
    92.
    发明申请
    Method for determining temperatures on semiconductor components 失效
    确定半导体元件温度的方法

    公开(公告)号:US20030161380A1

    公开(公告)日:2003-08-28

    申请号:US10311950

    申请日:2003-03-14

    CPC classification number: G01K11/00

    Abstract: In order to determine a temperature on a semiconductor component (1), a scanning light wave (7) is irradiated onto a measuring point on the semiconductor component, a response light wave (8, 8null) reflected from the measuring point is recorded, and the temperature of the measuring point is ascertained with the aid of a temperature-dependent property R of the response light wave (8, 8null).

    Abstract translation: 为了确定半导体元件(1)上的温度,将扫描光波照射到半导体元件上的测量点上,记录从测量点反射的响应光波(8,8'), 借助于响应光波(8,8')的温度依赖特性R来确定测量点的温度。

    Infrared light detection array and method of producing the same
    93.
    发明申请
    Infrared light detection array and method of producing the same 失效
    红外光检测阵列及其制作方法

    公开(公告)号:US20030111603A1

    公开(公告)日:2003-06-19

    申请号:US10286919

    申请日:2002-11-04

    CPC classification number: G01J5/40

    Abstract: An infrared light detection array with a plurality of infrared light detectors, said infrared light detectors each comprising: a supporting leg fixed to said substrate at one end, having a laminated structure of an insulation layer and a wiring layer; and a heat insulation structure portion supported by said supporting leg, comprising an insulation layer having a first surface to serve as a surface of incidence for infrared light to impinge on and a second surface to serve as a surface of incidence for reading light to impinge on, a reflection film which is formed on said second surface of said insulation layer, and a resistor connected with said wiring layer, and as said supporting legs heated up to a detection temperature by said infrared light reversibly warp, said infrared light detectors change the reflection direction of said reading light impinging upon said reflection films.

    Abstract translation: 一种具有多个红外光检测器的红外光检测阵列,所述红外光检测器包括:一端固定到所述基板的支撑腿,具有绝缘层和布线层的叠层结构; 以及由所述支撑腿支撑的绝热结构部分,包括绝缘层,其具有用作红外光入射的表面的第一表面和第二表面,以用作用于读取光的入射表面 ,形成在所述绝缘层的所述第二表面上的反射膜和与所述布线层连接的电阻器,并且当所述红外线灯被可逆地翘曲地加热到检测温度的所述支撑腿时,所述红外光检测器改变反射 所述读取光的方向撞击在所述反射膜上。

    Illumination and imaging devices and methods
    94.
    发明申请
    Illumination and imaging devices and methods 有权
    照明和成像设备和方法

    公开(公告)号:US20030047683A1

    公开(公告)日:2003-03-13

    申请号:US10204856

    申请日:2002-09-10

    Inventor: Tej Kaushal

    CPC classification number: G02B23/12

    Abstract: A thermal torch (12) comprises an infrared camera (22) and a visible light emitter (28, 26) arranged so as to illuminate hot objects with visible light. This projection of visible light onto the scene, rather than observing it at infrared wavelengths converted to visible light by a display screen, makes viewing the scene more natural. Applications include medical imaging equipment, nightdriving systems, stage lights, and security lights. The profile of the beam of visible light can be modulated with a beam profiler (26) which may be an LCD. The infrared camera (22) and visible projector (28, 26) may be bore-sighted to facilitate overlying of the visible projected image onto the scene.

    Abstract translation: 热炬(12)包括红外照相机(22)和可见光发射器(28,26),其布置成以可见光照亮热物体。 将可见光投射到场景上,而不是通过显示屏将红外波长观察转换成可见光,使观看场景更自然。 应用包括医疗成像设备,夜灯系统,舞台灯和安全灯。 可以用可以是LCD的光束轮廓仪(26)来调制可见光束的轮廓。 红外摄像机(22)和可见投影仪(28,26)可以被瞄准,以便于将可见投影图像覆盖到场景上。

    Temperature measuring apparatus
    95.
    发明申请
    Temperature measuring apparatus 有权
    温度测量仪

    公开(公告)号:US20030026321A1

    公开(公告)日:2003-02-06

    申请号:US10236372

    申请日:2002-09-06

    CPC classification number: G01K11/006

    Abstract: An improved apparatus for measuring the temperature of an object such as a food object. Also, a related method, container, transportation member and production line which utilizes this apparatus. The apparatus includes a coupling device for coupling radiation emanating from the object to at least a first radiation temperature measuring radiometer, and a first device for switching measurement circuitry between measuring the radiation temperature of at least a first reference temperature and the radiation temperature of the object.

    Abstract translation: 一种用于测量诸如食物的物体的温度的改进的装置。 另外,使用该装置的相关方法,容器,运输构件和生产线。 该装置包括用于将从物体发射的辐射耦合到至少第一辐射温度测量辐射计的耦合装置,以及用于在测量至少第一参考温度的辐射温度和物体的辐射温度之间切换测量电路的第一装置 。

    Night vision device
    97.
    发明申请
    Night vision device 审中-公开
    夜视仪

    公开(公告)号:US20030015662A1

    公开(公告)日:2003-01-23

    申请号:US09907568

    申请日:2001-07-19

    CPC classification number: H04N5/2256 G02B27/017 G02B2027/0138 H04N5/33

    Abstract: A night vision device comprises a head-mounting unit, an image-acquiring unit, a light source, an image-acquiring unit, a display unit and a DC power source. The light source, the image-acquiring unit, and the display unit are arranged on the head-mounting unit and are powered by the DC power source through a connector of the head-mounting unit. The night vision device provides hand free convenience for user.

    Abstract translation: 夜视装置包括头戴式装置,图像获取单元,光源,图像获取单元,显示单元和DC电源。 光源,图像获取单元和显示单元布置在头部安装单元上,并且通过头戴式安装单元的连接器由DC电源供电。 夜视设备为用户提供免提方便。

    Acoustic absorption electromagnetic radiation sensing with single crystal SiC
    98.
    发明申请
    Acoustic absorption electromagnetic radiation sensing with single crystal SiC 失效
    单晶SiC吸声电磁辐射检测

    公开(公告)号:US20030010917A1

    公开(公告)日:2003-01-16

    申请号:US09906441

    申请日:2001-07-16

    Applicant: HETRON

    Inventor: James D. Parsons

    CPC classification number: H01L31/0256 H01L31/0312 H01L31/036 H01L31/09

    Abstract: Single crystal SiC at least 200 micrometers thick is employed to detect electromagnetic radiation having a wavelength less than about 10 micrometers via an acoustic absorption mechanism. Applications include IR radiation sensing, contactless temperature sensing and an IR controlled varistor.

    Abstract translation: 使用至少200微米厚的单晶SiC通过声吸收机制检测波长小于约10微米的电磁辐射。 应用包括红外辐射感测,非接触式温度感测和红外控制压敏电阻。

    Solid state radiation detector
    99.
    发明申请
    Solid state radiation detector 失效
    固态放射线检测器

    公开(公告)号:US20030006388A1

    公开(公告)日:2003-01-09

    申请号:US10188046

    申请日:2002-07-03

    Inventor: Masaharu Ogawa

    CPC classification number: H01L27/14676

    Abstract: A solid state radiation detector provided with sub-stripe electrodes, which is capable of reading out stored charges efficiently. A first conductive layer, a recording photoconductive layer, a charge transport layer, a reading photoconductive layer, a second conductive layer provided with stripe electrodes composed of a large number of linear elements and sub-stripe electrodes composed of a large number of linear elements, an insulating layer, and a support body are arranged in accordance with the order listed above, light-shielding films are provided on portions on the support body, which correspond to the sub-stripe electrodes and the spaces between the stripe electrodes and the sub-stripe electrodes, and thus a solid state radiation detector is constituted. In this case, when a pair of the stripe electrode and the sub-strip electrode is defined as one cycle, the cycle is set to range from 10 nullm through 150 nullm.

    Abstract translation: 具有分条电极的固态放射线检测器,其能够有效地读出存储的电荷。 第一导电层,记录光电导层,电荷传输层,读取光电导层,由多个线性元件构成的条形电极的第二导电层和由大量线形元件构成的子条状电极, 绝缘层和支撑体按照上述顺序排列,在支撑体上的与子条状电极相对应的部分和条状电极与子条之间的间隔设置有遮光膜, 条形电极,因此构成固态放射线检测器。 在这种情况下,当将一对条状电极和副带状电极定义为一个周期时,将该周期设定为10μm〜150μm的范围。

    Readout technique for microbolometer array
    100.
    发明申请
    Readout technique for microbolometer array 有权
    微量热计阵列读出技术

    公开(公告)号:US20020190208A1

    公开(公告)日:2002-12-19

    申请号:US09883796

    申请日:2001-06-18

    Inventor: Roland A. Wood

    CPC classification number: H04N5/33 G01J5/24 H04N5/2176

    Abstract: A method and apparatus to reduce undesirable deficiencies in an image produced by a microbolometer array including multiple smaller arrays includes applying a separate bias pulse to each of the microbolometers in the smaller arrays and measuring a resulting signal corresponding to the applied bias pulse for each of the microbolometers using multiple measurement circuits associated with the smaller arrays during the frame time. Further, one or more known bias pulses are applied to the measurement circuitry during the frame time, one or more resulting calibration signals are measured, an offset parameter for each of the smaller arrays based on the corresponding measured resulting calibration signals is computed, and the measured resulting signal is corrected using the associated computed offset parameter to produce an output signal that reduces the undesirable deficiencies in the image produced by the array.

    Abstract translation: 一种减少由包括多个较小阵列的微热辐射计阵列产生的图像中的不期望的缺陷的方法和装置包括将单独的偏置脉冲施加到较小阵列中的每个微测辐射计,并测量对应于所施加的偏置脉冲 在帧时间期间使用与较小阵列相关联的多个测量电路的微测光计。 此外,在帧时间期间将一个或多个已知的偏置脉冲施加到测量电路,测量一个或多个所得到的校准信号,基于相应的测量得到的校准信号计算每个较小阵列的偏移参数,并且 使用相关联的计算的偏移参数来校正测得的结果信号以产生输出信号,其减少由阵列产生的图像中的不期望的不足。

Patent Agency Ranking