Method and apparatus for the application of force to a sample for detection using an electromechanical means
    5.
    发明授权
    Method and apparatus for the application of force to a sample for detection using an electromechanical means 有权
    用于使用机电装置向样品施加力进行检测的方法和装置

    公开(公告)号:US09366626B2

    公开(公告)日:2016-06-14

    申请号:US13922827

    申请日:2013-06-20

    CPC classification number: G01N21/552 G01J3/0272 G01N21/3563 G02B21/26

    Abstract: The embodiments of the present invention are directed to applying intimate contact pressures to samples while undergoing ATR infrared interrogation. As a general mode of operation, after a solid sample is placed on the ATR element, a force actuator moves an anvil arm to apply a contact force to the sample against the ATR. Thereafter, when the scan is over, the user can see the result of the one or more scans. The force actuator may be a motor or a solenoid or other type of force actuator. The applied contact force may be a fixed force or may be a user-selectable force or may be automatically controlled through feedback from the spectrometer based on the spectroscopic signature of the sample material.

    Abstract translation: 本发明的实施例涉及在进行ATR红外询问时对样品施加紧密的接触压力。 作为一般的操作模式,在将固体样品放置在ATR元件上之后,力致动器移动砧座臂以向ATR施加接触力。 此后,当扫描结束时,用户可以看到一次或多次扫描的结果。 力致动器可以是电动机或螺线管或其他类型的力致动器。 施加的接触力可以是固定的力,或者可以是用户可选择的力,或者可以基于样品材料的光谱特征从光谱仪的反馈自动控制。

Patent Agency Ranking