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公开(公告)号:US20220238672A1
公开(公告)日:2022-07-28
申请号:US17578981
申请日:2022-01-19
Applicant: Samsung Electronics Co., Ltd.
Inventor: Minhyun LEE , Taein KIM , Youngtek OH , Suhyeong LEE
IPC: H01L29/423 , H01L21/28 , H01L29/51 , H01L27/11582
Abstract: A vertical NAND flash memory device and a method of manufacturing the same are provided. The vertical NAND flash memory device includes a charge trap layer arranged on an inner wall of a channel hole vertically formed on a substrate. The charge trap layer includes nanostructures distributed in a base. The nanostructures may include a material having a trap density of about 1×1019 cm−3 to about 10×1019 cm−3, and the base may include a material having a conduction band offset (CBO) of about 0.5 eV to about 3.5 eV with respect to the material included in the nanostructures.
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公开(公告)号:US20220320135A1
公开(公告)日:2022-10-06
申请号:US17537984
申请日:2021-11-30
Applicant: Samsung Electronics Co., Ltd.
Inventor: Youngtek OH , Hyeyoung KWON , Taein KIM , Gukhyon YON , Minhyun LEE
IPC: H01L27/11582
Abstract: A nonvolatile memory device includes a channel layer, a plurality of gate electrodes and a plurality of separation layers spaced apart from the channel layer and alternately arranged, a charge trap layer between the gate electrodes in the channel layer, and a charge blocking layer between the charge trap layer and the gate electrode.
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公开(公告)号:US20220319602A1
公开(公告)日:2022-10-06
申请号:US17708362
申请日:2022-03-30
Applicant: Samsung Electronics Co., Ltd.
Inventor: Minhyun LEE , Taein KIM , Youngtek OH , Hyeonjin SHIN , Changseok LEE
IPC: G11C16/04 , H01L27/1157 , H01L27/11524 , H01L27/11551 , H01L27/11578
Abstract: Provided is a vertical nonvolatile memory device in which a thickness of one memory cell is reduced to reduce an entire thickness of a memory cell string and increase the number of stacked memory cells. The nonvolatile memory device includes a plurality of memory cell strings. Each of the memory cell strings may include a plurality of insulating spacers each extending in a first direction, a plurality of gate electrodes each extending in the first direction and alternately arranged with the plurality of insulating spacers in a second direction perpendicular to the first direction, and a plurality of contacts respectively arranged to contact a side surface of the plurality of gate electrodes respectively corresponding to the plurality of contacts.
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