公开(公告)号：US09875918B2

公开(公告)日：2018-01-23

申请号：US14788783

申请日：2015-06-30

Applicant: Samsung Electronics Co., Ltd.

Inventor： Kyu-Dong Jung ,  Jung-Hwan Kim ,  Dong-Gil Lee ,  Tae-Je Cho ,  Kwang-Chul Choi

IPC: B32B43/00 ,  H01L21/67 ,  B32B38/10 ,  B32B41/00

CPC classification number: H01L21/67115 ,  B32B38/10 ,  B32B41/00 ,  B32B43/006 ,  B32B2250/02 ,  B32B2310/0843 ,  B32B2457/14 ,  H01L21/67092 ,  H01L21/67253 ,  H01L2221/68381 ,  H01L2224/98 ,  Y10T156/1158 ,  Y10T156/1917

Abstract: Provided are an initiator and a method for debonding a wafer supporting system. The initiator for debonding a wafer supporting system includes a rotation chuck having an upper surface on which a wafer supporting system (WSS), which includes a carrier wafer, a device wafer, and a glue layer for bonding the carrier wafer and the device wafer to each other, is seated to rotate the wafer supporting system, a detecting module detecting a height and a thickness of the glue layer and a laser module generating a fracture portion on the glue layer through irradiating a side surface of the glue layer with a laser on the basis of the height and the thickness of the glue layer.

公开(公告)号：US08996959B2

公开(公告)日：2015-03-31

申请号：US13716360

申请日：2012-12-17

Applicant: Samsung Electronics Co., Ltd.

Inventor： Hyun-Uk Jung ,  Dong-Gil Lee ,  Jin-Yeong Kim

IPC: G11C29/42 ,  G06F11/10 ,  G06F12/00 ,  G06F12/02 ,  G11C29/54

CPC classification number: G06F11/10 ,  G06F11/1008 ,  G06F12/00 ,  G06F12/0246 ,  G06F2212/7205

Abstract: During a garbage collection process for a non-volatile memory device of a storage device, an adaptive copy-back method selectively performs either an external or an internal copy-back operation in view of certain performance conditions for a storage device. The external copy-back operation is performed when a number of error-corrected bits per unit size of read data exceeds a given threshold value, and the internal copy-back operation is performed when the number of error-corrected bits does not exceed the threshold value.

Abstract translation: 在存储装置的非易失性存储装置的垃圾收集处理期间，自适应复制方法根据存储装置的某些性能条件选择性地进行外部或内部复制操作。 当读取数据的每单位大小的错误校正位的数量超过给定的阈值时，执行外部复制操作，并且当纠错位的数量不超过阈值时执行内部复制操作 值。