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公开(公告)号:US11043553B2
公开(公告)日:2021-06-22
申请号:US16520912
申请日:2019-07-24
Applicant: Samsung Electronics Co., Ltd.
Inventor: Youn-soo Kim , Seung-min Ryu , Chang-su Woo , Hyung-suk Jung , Kyu-ho Cho , Youn-joung Cho
IPC: H01L21/02 , H01L49/02 , H01L27/108
Abstract: An integrated circuit device includes a lower electrode, an upper electrode, and a dielectric layer structure between the lower electrode and the upper electrode, the dielectric layer structure including a first surface facing the lower electrode and a second surface facing the upper electrode. The dielectric layer structure includes a first dielectric layer including a first dielectric material and a plurality of grains extending from the first surface to the second surface and a second dielectric layer including a second dielectric material and surrounding a portion of a sidewall of each of the plurality of grains of the first dielectric layer in a level lower than the second surface. The second dielectric material includes a material having bandgap energy which is higher than bandgap energy of the first dielectric material.
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公开(公告)号:US11929389B2
公开(公告)日:2024-03-12
申请号:US17324492
申请日:2021-05-19
Applicant: Samsung Electronics Co., Ltd.
Inventor: Youn-soo Kim , Seung-min Ryu , Chang-su Woo , Hyung-suk Jung , Kyu-ho Cho , Youn-joung Cho
CPC classification number: H01L28/40 , H10B12/315
Abstract: An integrated circuit device includes a lower electrode, an upper electrode, and a dielectric layer structure between the lower electrode and the upper electrode, the dielectric layer structure including a first surface facing the lower electrode and a second surface facing the upper electrode. The dielectric layer structure includes a first dielectric layer including a first dielectric material and a plurality of grains extending from the first surface to the second surface and a second dielectric layer including a second dielectric material and surrounding a portion of a sidewall of each of the plurality of grains of the first dielectric layer in a level lower than the second surface. The second dielectric material includes a material having bandgap energy which is higher than bandgap energy of the first dielectric material.
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公开(公告)号:US20200091275A1
公开(公告)日:2020-03-19
申请号:US16520912
申请日:2019-07-24
Applicant: Samsung Electronics Co., Ltd.
Inventor: Youn-soo Kim , Seung-min Ryu , Chang-su Woo , Hyung-suk Jung , Kyu-ho Cho , Youn-joung Cho
IPC: H01L49/02 , H01L27/108
Abstract: An integrated circuit device includes a lower electrode, an upper electrode, and a dielectric layer structure between the lower electrode and the upper electrode, the dielectric layer structure including a first surface facing the lower electrode and a second surface facing the upper electrode. The dielectric layer structure includes a first dielectric layer including a first dielectric material and a plurality of grains extending from the first surface to the second surface and a second dielectric layer including a second dielectric material and surrounding a portion of a sidewall of each of the plurality of grains of the first dielectric layer in a level lower than the second surface. The second dielectric material includes a material having bandgap energy which is higher than bandgap energy of the first dielectric material.
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