公开(公告)号：US20210286002A1

公开(公告)日：2021-09-16

申请号：US17191581

申请日：2021-03-03

Applicant: Samsung Display Co., Ltd.

Inventor： HWAYOUNG SONG ,  SEUNGWOO SUNG ,  DONG EUP LEE ,  SEUNGJI CHA ,  KIMYEONG EOM ,  KWANGSAE LEE

IPC: G01R31/317 ,  G09G3/20

Abstract: A display panel test circuit includes a first transistor connected to a first data line and receiving a red lighting test signal, a second transistor connected to the first data line and receiving a blue lighting test signal, a third transistor connected to a second data line and receiving a first green lighting test signal, a fourth transistor connected to a third data line and receiving the red lighting test signal, a fifth transistor connected to the third data line and receiving the blue lighting test signal, a sixth transistor connected to a fourth data line and receiving a second green lighting test signal, a seventh transistor connected to the second data line and receiving a crack test signal, and an eighth transistor connected to the fourth data line and receiving the crack test signal. The display panel test circuit performs one or more tests on a display panel.