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1.Measurement of impurity concentration in semiconducting material 失效
Title translation: 测量半导体材料中的杂质浓度公开(公告)号:US3109932A
公开(公告)日:1963-11-05
申请号:US6128860
申请日:1960-10-07
Applicant: BELL TELEPHONE LABOR INC
Inventor: SPITZER WILLIAM G
IPC: G01N21/88 , G01R31/308 , H01L21/00 , H01L21/66 , H01L29/36
CPC classification number: G01N21/88 , G01R31/308 , H01L21/00 , H01L22/00 , H01L29/36
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2.Method for increasing the doping level of semiconductor materials 失效
Title translation: 提高半导体材料掺杂浓度的方法公开(公告)号:US3111433A
公开(公告)日:1963-11-19
申请号:US8397261
申请日:1961-01-23
Applicant: BELL TELEPHONE LABOR INC
Inventor: LOGAN RALPH A , SPITZER WILLIAM G , TRUMBORE FORREST A
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公开(公告)号:US3099579A
公开(公告)日:1963-07-30
申请号:US5487260
申请日:1960-09-09
Applicant: BELL TELEPHONE LABOR INC
Inventor: SPITZER WILLIAM G , MORRIS TANENBAUM
CPC classification number: G01B11/0675 , H01L22/12 , Y10S118/90 , Y10S148/052
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