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公开(公告)号:US20250109989A1
公开(公告)日:2025-04-03
申请号:US18829173
申请日:2024-09-09
Applicant: Apple Inc.
Inventor: Mark A. Arbore , Thomas C. Greening , Matthew A. Terrel , Trent D. Ridder
Abstract: Various embodiments disclosed herein describe photonic integrated circuits and associated optical measurement systems. The photonic integrated circuit may be configured to simultaneously output light of different wavelengths from different outputs of a multiplexer. A switch network, which may include a multiplexing photonic switch, may be used to selectively route the different wavelengths to a common set of launch groups, from which the light may be emitted from the photonic integrated circuit.
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公开(公告)号:US11740126B2
公开(公告)日:2023-08-29
申请号:US17351067
申请日:2021-06-17
Applicant: Apple Inc.
Inventor: Trent D. Ridder , Mark Alan Arbore , Gary Shambat , Robert Chen , David I. Simon , Miikka M. Kangas
CPC classification number: G01J3/427 , G01J3/06 , G01J3/10 , G01J3/108 , G01J3/2803 , G01J3/2846 , G01J3/42 , G01N21/25 , G01N21/35
Abstract: Methods and systems for measuring one or more properties of a sample are disclosed. The methods and systems can include multiplexing measurements of signals associated with a plurality of wavelengths without adding any signal independent noise and without increasing the total measurement time. One or more levels of encoding, where, in some examples, a level of encoding can be nested within one or more other levels of encoding. Multiplexing can include wavelength, position, and detector state multiplexing. In some examples, SNR can be enhanced by grouping together one or more signals based on one or more properties including, but not limited to, signal intensity, drift properties, optical power detected, wavelength, location within one or more components, material properties of the light sources, and electrical power. In some examples, the system can be configured for optimizing the conditions of each group individually based on the properties of a given group.
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公开(公告)号:US11041758B2
公开(公告)日:2021-06-22
申请号:US16095323
申请日:2017-04-13
Applicant: Apple Inc.
Inventor: Trent D. Ridder , Mark Alan Arbore , Gary Shambat , Robert Chen , David I. Simon , Miikka M. Kangas
Abstract: Methods and systems for measuring one or more properties of a sample are disclosed. The methods and systems can include multiplexing measurements of signals associated with a plurality of wavelengths without adding any signal independent noise and without increasing the total measurement time. One or more levels of encoding, where, in some examples, a level of encoding can be nested within one or more other levels of encoding. Multiplexing can include wavelength, position, and detector state multiplexing. In some examples, SNR can be enhanced by grouping together one or more signals based on one or more properties including, but not limited to, signal intensity, drift properties, optical power detected, wavelength, location within one or more components, material properties of the light sources, and electrical power. In some examples, the system can be configured for optimizing the conditions of each group individually based on the properties of a given group.
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公开(公告)号:US20210310867A1
公开(公告)日:2021-10-07
申请号:US17351067
申请日:2021-06-17
Applicant: Apple Inc.
Inventor: Trent D. Ridder , Mark Alan Arbore , Gary Shambat , Robert Chen , David I. Simon , Miikka M. Kangas
Abstract: Methods and systems for measuring one or more properties of a sample are disclosed. The methods and systems can include multiplexing measurements of signals associated with a plurality of wavelengths without adding any signal independent noise and without increasing the total measurement time. One or more levels of encoding, where, in some examples, a level of encoding can be nested within one or more other levels of encoding. Multiplexing can include wavelength, position, and detector state multiplexing. In some examples, SNR can be enhanced by grouping together one or more signals based on one or more properties including, but not limited to, signal intensity, drift properties, optical power detected, wavelength, location within one or more components, material properties of the light sources, and electrical power. In some examples, the system can be configured for optimizing the conditions of each group individually based on the properties of a given group.
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公开(公告)号:US20250110043A1
公开(公告)日:2025-04-03
申请号:US18886953
申请日:2024-09-16
Applicant: Apple Inc.
Inventor: Mark A. Arbore , Alexander A. Miles , Matthew A. Terrel , Victoria Hwang , Samuel Steven , Trent D. Ridder , Jeffrey T. Hill , Sinclair A. Minshull
IPC: G01N21/31 , G01N33/483
Abstract: The disclosure relates to embodiments of optical measurement systems that are configured to perform spectroscopic measurements. The optical measurement systems are configured to provide compact arrangements for introducing light into a sample and collecting light returned from the sample. Reducing the size of the launch and/or collection architecture of an optical measurement system may make the overall optical measurement system smaller, thereby providing flexibility in integrating an optical measurement system into various form factors.
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公开(公告)号:US10690591B2
公开(公告)日:2020-06-23
申请号:US15751454
申请日:2016-08-29
Applicant: Apple Inc.
Inventor: Robert Chen , Trent D. Ridder , Miikka M. Kangas , David I. Simon , Matthew A. Terrel
Abstract: Methods and systems for measurement time distribution for referencing schemes are disclosed. The disclosed methods and systems can be capable of dynamically changing the measurement time distribution based on the sample signal, reference signal, noise levels, and SNR. The methods and systems can be configured with a plurality of measurement states, including a sample measurement state, reference measurement state, and dark measurement state. In some examples, the measurement time distribution scheme can be based on the operating wavelength, the measurement location at the sampling interface, and/or targeted SNR. Examples of the disclosure further include systems and methods for measuring the different measurement states concurrently. Moreover, the systems and methods can include a high-frequency detector to eliminate or reduce decorrelated noise fluctuations that can lower the SNR.
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