公开(公告)号：US20140009176A1

公开(公告)日：2014-01-09

申请号：US13691285

申请日：2012-11-30

Applicant: APPLE INC.

Inventor： Saman Saeedi ,  Shafiq M. Jamal ,  Ahmad AI-Dahle

IPC: G01R27/26

CPC classification number: G01R27/2605 ,  G09G3/006 ,  G09G3/3648 ,  G09G2320/043

Abstract: A resistor having a known resistance is coupled in series with a device under test (DUT) having an unknown capacitance. An ac signal source having a known fundamental frequency is coupled to drive the resistor to thereby produce a first ac signal. A phase controllable signal generator produces a second ac signal. The first and second ac signals are fed to a mixer. An output of the mixer is low pass filtered. A peak detector monitors the low pass filtered output while sweeping the phase controllable signal generator, until a peak is detected. The set phase corresponding to the detected peak is then used to obtain an estimate of the unknown DUT capacitance. Other embodiments are also described and claimed.

Abstract translation: 具有已知电阻的电阻器与具有未知电容的被测器件（DUT）串联耦合。 具有已知基频的交流信号源被耦合以驱动电阻器从而产生第一交流信号。 相位可控信号发生器产生第二交流信号。 第一和第二交流信号被馈送到混频器。 混频器的输出被低通滤波。 峰值检测器在扫描相位可控信号发生器时监视低通滤波输出，直到检测到峰值。 然后使用与检测到的峰对应的设定相位来获得未知DUT电容的估计。 还描述和要求保护其他实施例。

公开(公告)号：US20130110447A1

公开(公告)日：2013-05-02

申请号：US13657732

申请日：2012-10-22

Applicant: Apple Inc.

Inventor： Shawn Gettemy ,  Wei Yao ,  Ahmad AI-Dahle

IPC: G01R31/28

CPC classification number: G01R31/2834 ,  G06F11/2733 ,  G09G3/006

Abstract: Systems and methods for testing a peripheral in accordance with a MIPI protocol are provided. A test system can test a peripheral by providing user-5 specified control over a test processor (which is substantially the same processor the peripheral will interface with when installed) to test, calibrate, or both test and calibrate the peripheral. The test processor can communicate with the peripheral according 10 to the MIPI protocol, thereby effectively providing an actual “in-device” environment for testing and/or calibrating the peripheral.

Abstract translation: 提供了根据MIPI协议测试外设的系统和方法。 测试系统可以通过在测试处理器上提供用户5指定的控制来测试外围设备（这是外部设备在安装时将与之相同的处理器），以测试，校准或测试和校准外设。 测试处理器可以根据10与MIPI协议与外围设备进行通信，从而有效提供用于测试和/或校准外设的实际“设备内”环境。