- 专利标题: Semiconductor memory device for sensing memory cell with variable resistance
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申请号: US15065449申请日: 2016-03-09
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公开(公告)号: US09747966B2公开(公告)日: 2017-08-29
- 发明人: Katsuyuki Fujita
- 申请人: KABUSHIKI KAISHA TOSHIBA
- 申请人地址: JP Tokyo
- 专利权人: TOSHIBA MEMORY CORPORATION
- 当前专利权人: TOSHIBA MEMORY CORPORATION
- 当前专利权人地址: JP Tokyo
- 代理机构: Holtz, Holtz & Volek PC
- 主分类号: G11C11/16
- IPC分类号: G11C11/16 ; H01L27/22 ; H01L43/08 ; G11C5/14
摘要:
According to one embodiment, a semiconductor memory device includes a memory cell; a reference signal generation circuit; a sense amplifier; a first transistor configured to electrically couple the memory cell and a first input terminal of the sense amplifier; a second transistor configured to electrically couple the reference signal generation circuit and a second input terminal of the sense amplifier; a first control circuit configured to supply a voltage to gates of the first transistor and the second transistor; a second control circuit configured to supply a first voltage except 0V to a back gate of the first transistor; and a third control circuit configured to supply a second voltage except 0V to a back gate of the second transistor.
公开/授权文献
- US20170062033A1 SEMICONDUCTOR MEMORY DEVICE 公开/授权日:2017-03-02
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