Invention Grant
- Patent Title: Memory device and read method of memory device
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Application No.: US15294849Application Date: 2016-10-17
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Publication No.: US09741440B2Publication Date: 2017-08-22
- Inventor: Kyung-Ryun Kim
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si, Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si, Gyeonggi-do
- Agency: Volentine & Whitt, PLLC
- Priority: KR10-2014-0096217 20140729
- Main IPC: G11C16/26
- IPC: G11C16/26 ; G11C16/14 ; G11C8/08 ; G11C8/14 ; G11C16/04 ; G11C16/08

Abstract:
In a method of reading a memory device, difference information is generated based on a distance difference between a position of a read word-line and a position of a boundary word-line. The read word-line corresponds to a read address. The boundary word-line corresponds to a last programmed word-line in a memory block included in a memory cell array. A read word-line voltage and an adjacent word-line voltage are determined based on the difference information. The read word-line voltage is applied to the read word-line. The adjacent word-line voltage is applied to an adjacent word-line that is adjacent to the read word-line. A read data corresponding to the read address is outputted based on the read word-line voltage and the adjacent word-line voltage. The read method of the memory device according to example embodiments may be capable of increasing the performance by controlling the voltages applied to the adjacent word-line and the read word-line according to the difference information determined based on the read word-line and the boundary word-line.
Public/Granted literature
- US20170032844A1 MEMORY DEVICE AND READ METHOD OF MEMORY DEVICE Public/Granted day:2017-02-02
Information query