Invention Grant
- Patent Title: Methods and apparatus for vertical cross point re-RAM array bias calibration
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Application No.: US14502093Application Date: 2014-09-30
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Publication No.: US09715925B2Publication Date: 2017-07-25
- Inventor: Chang Siau , Tianhong Yan
- Applicant: SanDisk 3D LLC
- Applicant Address: US TX Plano
- Assignee: SANDISK TECHNOLOGIES LLC
- Current Assignee: SANDISK TECHNOLOGIES LLC
- Current Assignee Address: US TX Plano
- Agency: Vierra Magen Marcus LLP
- Main IPC: G11C13/00
- IPC: G11C13/00

Abstract:
Methods for operating a non-volatile storage system are described. The non-volatile storage system includes a plurality of bit lines, a plurality of word line combs each comprising a plurality of word lines, and a plurality of resistance-switching memory elements. Each resistance-switching memory element is coupled between one of the bit lines and one of the word lines. The method includes calibrating a plurality of bias voltages for the word lines and bit lines based on estimates of data values stored in the resistance-switching memory elements.
Public/Granted literature
- US20160093374A1 METHODS AND APPARATUS FOR VERTICAL CROSS POINT RE-RAM ARRAY BIAS CALIBRATION Public/Granted day:2016-03-31
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