发明授权
- 专利标题: High density TiN RF/DC PVD deposition with stress tuning
- 专利标题(中): 高密度TiN RF / DC PVD沉积与应力调谐
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申请号: US13750318申请日: 2013-01-25
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公开(公告)号: US09499901B2公开(公告)日: 2016-11-22
- 发明人: Yong Cao , Xianmin Tang , Adolph Miller Allen , Tza-Jing Gung
- 申请人: APPLIED MATERIALS, INC.
- 申请人地址: US CA Santa Clara
- 专利权人: APPLIED MATERIALS, INC.
- 当前专利权人: APPLIED MATERIALS, INC.
- 当前专利权人地址: US CA Santa Clara
- 代理机构: Moser Taboada
- 代理商 Alan Taboada
- 主分类号: C23C14/34
- IPC分类号: C23C14/34 ; C23C14/35 ; C23C14/54 ; H01J37/34
摘要:
Methods for depositing a layer on a substrate are provided herein. In some embodiments, a method of depositing a metal-containing layer on a substrate in a physical vapor deposition (PVD) chamber may include applying RF power at a VHF frequency to a target comprising a metal disposed in the PVD chamber above the substrate to form a plasma from a plasma-forming gas; optionally applying DC power to the target; sputtering metal atoms from the target using the plasma while maintaining a first pressure in the PVD chamber sufficient to ionize a predominant portion of the sputtered metal atoms; and controlling the potential on the substrate to be the same polarity as the ionized metal atoms to deposit a metal-containing layer on the substrate.
公开/授权文献
- US20130199925A1 HIGH DENSITY TiN RF/DC PVD DEPOSITION WITH STRESS TUNING 公开/授权日:2013-08-08
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