Invention Grant
- Patent Title: Distinguishing foreign surface features from native surface features
- Patent Title (中): 区分异常表面特征与原生表面特征
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Application No.: US14032186Application Date: 2013-09-19
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Publication No.: US09377394B2Publication Date: 2016-06-28
- Inventor: Joachim Walter Ahner , David M. Tung , Samuel Kah Hean Wong , Henry Luis Lott , Stephen Keith McLaurin , Maissarath Nassirou , Florin Zavaliche
- Applicant: Seagate Technology LLC
- Applicant Address: US CA Cupertino
- Assignee: Seagate Technology LLC
- Current Assignee: Seagate Technology LLC
- Current Assignee Address: US CA Cupertino
- Main IPC: G01N21/00
- IPC: G01N21/00 ; G01N21/94 ; G01N21/95
Abstract:
Provided herein is an apparatus, including a photon detector array; and a processing means configured for processing photon-detector-array signals corresponding to a first set of photons scattered from surface features of an article focused in a first focal plane and a second set of photons scattered from surface features of an article focused in a second focal plane, wherein the processing means is further configured for distinguishing foreign surface features of the article from foreign native features of the article.
Public/Granted literature
- US20140104604A1 DISTINGUISHING FOREIGN SURFACE FEATURES FROM NATIVE SURFACE FEATURES Public/Granted day:2014-04-17
Information query
