Invention Grant
- Patent Title: 3D semiconductor devices and methods of fabricating same
-
Application No.: US14047578Application Date: 2013-10-07
-
Publication No.: US09355913B2Publication Date: 2016-05-31
- Inventor: Sang-Yong Park , Jintaek Park , Hansoo Kim , Juhyuck Chung , Wonseok Cho
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si, Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si, Gyeonggi-do
- Agency: Volentine & Whitt, PLLC
- Priority: KR10-2010-0114544 20101117
- Main IPC: H01L21/82
- IPC: H01L21/82 ; H01L21/44 ; H01L29/792 ; H01L21/8234 ; H01L27/115 ; H01L29/76 ; H01L29/788 ; H01L29/66

Abstract:
A three dimensional (3D) semiconductor device includes; a vertical channel extending from a lower end proximate a substrate to an upper end and connecting a plurality of memory cells, and a cell array comprising the plurality of cells, wherein the cell array is arranged in a gate stack of layers having a stair-stepped structure disposed on the substrate. The gate stack includes a lower layer including a lower select line coupled to a lower non-memory transistor proximate the lower end, upper layers including conductive lines respectively coupled to an upper non-memory transistor proximate the upper end and connected as a single conductive piece to form an upper select line, and intermediate layers respectively including a word line and coupled to a cell transistor, wherein the intermediate layers are disposed between the lower select line and the upper select line.
Public/Granted literature
- US20140038400A1 3D SEMICONDUCTOR DEVICES AND METHODS OF FABRICATING SAME Public/Granted day:2014-02-06
Information query
IPC分类: