Invention Grant
US09285362B2 Measuring multiple analytes over a broad range of concentrations using optical diffraction
有权
使用光学衍射在宽范围的浓度范围内测量多种分析物
- Patent Title: Measuring multiple analytes over a broad range of concentrations using optical diffraction
- Patent Title (中): 使用光学衍射在宽范围的浓度范围内测量多种分析物
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Application No.: US12445760Application Date: 2007-10-18
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Publication No.: US09285362B2Publication Date: 2016-03-15
- Inventor: Jean-Francois Houle , Sriram Kumaraswamy
- Applicant: Jean-Francois Houle , Sriram Kumaraswamy
- Applicant Address: CA Toronto
- Assignee: Axela, Inc.
- Current Assignee: Axela, Inc.
- Current Assignee Address: CA Toronto
- Agency: Clark & Elbing LLP
- International Application: PCT/CA2007/001840 WO 20071018
- International Announcement: WO2008/046213 WO 20080424
- Main IPC: G01N33/543
- IPC: G01N33/543 ; G01N21/03 ; G01N21/47 ; G01N33/68 ; G01N33/72 ; G01N33/74 ; G01N33/78 ; G01N33/92
Abstract:
Methods, devices, and kits for measuring multiple analytes in a sample having a broad range of concentrations using optical diffraction are disclosed. Devices, methods, and kits useful for monitoring and diagnosing diabetes, cardiovascular disease, thyroid disease, hormone-related conditions, and sepsis are also described.
Public/Granted literature
- US20110091865A1 MEASURING MULTIPLE ANALYTES OVER A BROAD RANGE OF CONCENTRATIONS USING OPTICAL DIFFRACTION Public/Granted day:2011-04-21
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