Invention Grant
- Patent Title: Mechanism for forming gate
- Patent Title (中): 形成门的机制
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Application No.: US14080368Application Date: 2013-11-14
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Publication No.: US09281215B2Publication Date: 2016-03-08
- Inventor: Jung-Chi Jeng , I-Chih Chen , Wen-Chang Kuo , Ying-Hao Chen , Ru-Shang Hsiao , Chih-Mu Huang
- Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
- Applicant Address: TW Hsin-Chu
- Assignee: Taiwan Semiconductor Manufacturing Co., LTD.
- Current Assignee: Taiwan Semiconductor Manufacturing Co., LTD.
- Current Assignee Address: TW Hsin-Chu
- Agency: Birch, Stewart, Kolasch & Birch, LLP
- Main IPC: H01L27/085
- IPC: H01L27/085 ; H01L27/088 ; H01L29/49 ; H01L21/8238 ; H01L21/3213 ; H01L21/28 ; H01L29/423 ; H01L29/66

Abstract:
Embodiments of mechanisms for forming a semiconductor device are provided. The semiconductor device includes a semiconductor substrate. The semiconductor device also includes an isolation structure in the semiconductor substrate and surrounding an active region of the semiconductor substrate. The semiconductor device includes a gate over the semiconductor substrate. The gate has an intermediate portion over the active region and two end portions connected to the intermediate portion. Each of the end portions has a first gate length longer than a second gate length of the intermediate portion and is located over the isolation structure.
Public/Granted literature
- US20150129940A1 MECHANISM FOR FORMING GATE Public/Granted day:2015-05-14
Information query
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