发明授权
- 专利标题: Electron microscope sample holder and sample observation method
- 专利标题(中): 电子显微镜样品架和样品观察法
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申请号: US14002056申请日: 2011-10-28
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公开(公告)号: US09159530B2公开(公告)日: 2015-10-13
- 发明人: Kotaro Hosoya , Masaomi Ohno , Haruhiko Hatano
- 申请人: Kotaro Hosoya , Masaomi Ohno , Haruhiko Hatano
- 申请人地址: JP Tokyo
- 专利权人: HITACHI HIGH-TECHNOLOGIES CORPORATION
- 当前专利权人: HITACHI HIGH-TECHNOLOGIES CORPORATION
- 当前专利权人地址: JP Tokyo
- 代理机构: Mattingly & Malur, PC
- 优先权: JP2011-047069 20110304
- 国际申请: PCT/JP2011/075001 WO 20111028
- 国际公布: WO2012/120726 WO 20120913
- 主分类号: H01J37/20
- IPC分类号: H01J37/20 ; H01J37/28
摘要:
The present invention makes it possible, even when using an ordinary electron beam device (not an environment-controlled electron beam device), to create locally a low vacuum condition in the vicinity of a sample and cool said sample by means of a sample holder alone, without modifying the device or adding equipment such as a gas cylinder. The sample to be observed is placed in a sample holder provided with: a vessel that can contain a substance to serve as a gas source; and a through-hole in the bottom of a sample mount on said vessel. Via the through-hole, gas evaporating or volatilizing from the vessel is supplied to the sample under observation, thereby creating a localized low-vacuum state at or in the vicinity of the sample. Also, the heat of vaporization required for volatilization can be used to cool the sample.
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