Invention Grant
- Patent Title: Optical measurement apparatus and probe apparatus
- Patent Title (中): 光学测量装置和探头装置
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Application No.: US13869631Application Date: 2013-04-24
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Publication No.: US09122016B2Publication Date: 2015-09-01
- Inventor: Hideyuki Takaoka , Yuki Shono , Ryosuke Ito
- Applicant: OLYMPUS CORPORATION
- Applicant Address: JP Tokyo
- Assignee: OLYMPUS CORPORATION
- Current Assignee: OLYMPUS CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Oliff PLC
- Main IPC: G01N21/47
- IPC: G01N21/47 ; G02B6/35 ; A61B1/00 ; A61B1/07 ; A61B5/00 ; A61B1/06

Abstract:
An optical measurement apparatus that measures an optical property of a scattering medium includes a light source that supplies illumination light having at least one spectral component, an illumination fiber for guiding the light supplied by the light source and emitting the light to the scattering medium, a detection fiber for receiving returned light from the scattering medium at a tip thereof and guiding the returned light toward a base end thereof, a detecting unit that detects light output from the base end of the detection fiber, a measuring unit that measures a property of the scattering medium based on a detection result obtained by the detecting unit, and a switching unit that switches between total areas of emission regions, in which light is emitted, at an end face of the illumination fiber.
Public/Granted literature
- US20130329224A1 OPTICAL MEASUREMENT APPARATUS AND PROBE APPARATUS Public/Granted day:2013-12-12
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