发明授权
- 专利标题: Atomic layer deposition apparatus
- 专利标题(中): 原子层沉积装置
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申请号: US14149560申请日: 2014-01-07
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公开(公告)号: US09031685B2公开(公告)日: 2015-05-12
- 发明人: Barry L. Chin , Alfred W. Mak , Lawrence C. Lei , Ming Xi , Hua Chung , Ken Kaung Lai , Jeong Soo Byun
- 申请人: Applied Materials, Inc.
- 申请人地址: US CA Santa Clara
- 专利权人: Applied Materials, Inc.
- 当前专利权人: Applied Materials, Inc.
- 当前专利权人地址: US CA Santa Clara
- 代理机构: Patterson & Sheridan, LLP
- 主分类号: G06F19/00
- IPC分类号: G06F19/00 ; C23C16/455 ; C23C16/458
摘要:
A method and apparatus for atomic layer deposition (ALD) is described. In one embodiment, an apparatus comprises a vacuum chamber body having a contiguous internal volume comprised of a first deposition region spaced-apart from a second deposition region, the chamber body having a feature operable to minimize intermixing of gases between the first and the second deposition regions, a first gas port formed in the chamber body and positioned to pulse gas preferentially to the first deposition region to enable a first deposition process to be performed in the first deposition region, and a second gas port formed in the chamber body and positioned to pulse gas preferentially to the second deposition region to enable a second deposition process to be performed in the second deposition region is provided.
公开/授权文献
- US20140130739A1 ATOMIC LAYER DEPOSITION APPARATUS 公开/授权日:2014-05-15
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