发明授权
US09030675B2 Method for determining a distance between two beamlets in a multi-beamlet exposure apparatus
有权
用于确定多子束曝光设备中的两个子束之间的距离的方法
- 专利标题: Method for determining a distance between two beamlets in a multi-beamlet exposure apparatus
- 专利标题(中): 用于确定多子束曝光设备中的两个子束之间的距离的方法
-
申请号: US13295159申请日: 2011-11-14
-
公开(公告)号: US09030675B2公开(公告)日: 2015-05-12
- 发明人: Jan Andries Meijer
- 申请人: Jan Andries Meijer
- 申请人地址: NL Delft
- 专利权人: Mapper Lithography IP B.V.
- 当前专利权人: Mapper Lithography IP B.V.
- 当前专利权人地址: NL Delft
- 代理机构: Hoyng Monegier LLP
- 代理商 David P. Owen
- 主分类号: G01B11/14
- IPC分类号: G01B11/14 ; H01J37/304 ; B82Y10/00 ; B82Y40/00 ; H01J37/22 ; H01J37/244 ; H01J37/317
摘要:
The invention relates to a method for determining a distance between charged particle beamlets in a multi-beamlet exposure apparatus. The apparatus is provided with a sensor comprising a converter element for converting charged particle energy into light and a light sensitive detector provided with a two-dimensional pattern of beamlet blocking and non-blocking regions. The method comprises scanning a first beamlet over the pattern, receiving light generated by the converter element, and converting the received light into a first signal. Then the two-dimensional pattern and the first beamlet are moved relatively with respect to each other over a predetermined distance. Subsequently, the method comprises scanning a second beamlet over the pattern, receiving light generated by the converter element, and converting the received light into a second signal. Finally, the distance between the first beamlet and second beamlet is determined based on the first signal, the second signal and the predetermined distance.
公开/授权文献
信息查询