Invention Grant
- Patent Title: Methods of calibrating X-ray detectors
- Patent Title (中): 校准X射线探测器的方法
-
Application No.: US13904600Application Date: 2013-05-29
-
Publication No.: US08985853B2Publication Date: 2015-03-24
- Inventor: Chae-hun Lee , Jae-chul Park , Young Kim , Ho Kyung Kim , Dae-kun Yoon
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR KR
- Assignee: Samsung Electronics Co., Ltd.,Pusan National University Industry-University Cooperation Foundation
- Current Assignee: Samsung Electronics Co., Ltd.,Pusan National University Industry-University Cooperation Foundation
- Current Assignee Address: KR KR
- Agency: Harness, Dickey & Pierce, PLC
- Priority: KR10-2012-0123098 20121101
- Main IPC: G01D18/00
- IPC: G01D18/00 ; G01T7/00

Abstract:
A method of calibrating a first threshold voltage that is a reference of X-ray detection for each unit cell of a plurality of unit cells of an X-ray detector may comprise detecting an X-ray by using a plurality of second threshold voltages for each of a plurality of X-rays having spectra at different energy levels; determining a correspondence relationship between energies having a maximum intensity in the spectra of X-rays and third threshold voltages at which a maximum number of photons having a same energy intensity are detected; and/or calibrating the first threshold voltage based on the determined correspondence relationship.
Public/Granted literature
- US20140119517A1 METHODS OF CALIBRATING X-RAY DETECTORS Public/Granted day:2014-05-01
Information query