发明授权
- 专利标题: Semiconductor device and method for fabricating the same
- 专利标题(中): 半导体装置及其制造方法
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申请号: US13717512申请日: 2012-12-17
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公开(公告)号: US08906775B2公开(公告)日: 2014-12-09
- 发明人: Heung-Jae Cho , Eui-Seong Hwang , Tae-Yoon Kim , Kyu-Hyung Yoon
- 申请人: SK Hynix Inc.
- 申请人地址: KR Gyeonggi-do
- 专利权人: SK Hynix Inc.
- 当前专利权人: SK Hynix Inc.
- 当前专利权人地址: KR Gyeonggi-do
- 代理机构: IP & T Group LLP
- 优先权: KR10-2012-0112486 20121010
- 主分类号: H01L21/30
- IPC分类号: H01L21/30 ; H01L29/02 ; H01L49/02 ; H01L21/18 ; H01L27/108
摘要:
A method for fabricating a semiconductor device includes forming a first semiconductor wafer, in which a circuit part and a first bonding layer are stacked, on a first semiconductor substrate, forming a second semiconductor wafer, which includes structures and an insulating layer for gap-filling between the structures, on a second semiconductor substrate, the structures including a pillar and bit lines stacked therein, bonding the first semiconductor wafer with the second semiconductor wafer so that the first bonding layer faces the insulating layer, and separating the second semiconductor substrate from the bonded second semiconductor wafer.
公开/授权文献
- US20140097519A1 SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME 公开/授权日:2014-04-10
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