发明授权
- 专利标题: Enhancement mode GaN HEMT device
- 专利标题(中): 增强型GaN HEMT器件
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申请号: US13838792申请日: 2013-03-15
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公开(公告)号: US08890168B2公开(公告)日: 2014-11-18
- 发明人: Alexander Lidow , Robert Beach , Alana Nakata , Jianjun Cao , Guang Yuang Zhao
- 申请人: Efficient Power Conversion Corporation
- 申请人地址: US CA El Segundo
- 专利权人: Efficient Power Conversion Corporation
- 当前专利权人: Efficient Power Conversion Corporation
- 当前专利权人地址: US CA El Segundo
- 代理机构: Dickstein Shapiro LLP
- 主分类号: H01L21/48
- IPC分类号: H01L21/48 ; H01L29/778 ; H01L29/10 ; H01L29/40 ; H01L29/66 ; H01L29/20
摘要:
An enhancement-mode GaN transistor. The enhancement-mode GaN transistor includes a substrate, transition layers, a buffer layer comprised of a III Nitride material, a barrier layer comprised of a III Nitride material, drain and source contacts, a gate III-V compound containing acceptor type dopant elements, and a gate metal, where the gate III-V compound and the gate metal are formed with a single photo mask process to be self-aligned and the bottom of the gate metal and the top of the gate compound have the same dimension. The enhancement mode GaN transistor may also have a field plate made of Ohmic metal, where a drain Ohmic metal, a source Ohmic metal, and the field plate are formed by a single photo mask process.
公开/授权文献
- US20130234153A1 ENHANCEMENT MODE GaN HEMT DEVICE 公开/授权日:2013-09-12
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