Invention Grant
US08889431B2 Magnetic tunnel junction (MTJ) and methods, and magnetic random access memory (MRAM) employing same
有权
磁隧道结(MTJ)和方法以及采用磁路随机存取存储器(MRAM)的方法
- Patent Title: Magnetic tunnel junction (MTJ) and methods, and magnetic random access memory (MRAM) employing same
- Patent Title (中): 磁隧道结(MTJ)和方法以及采用磁路随机存取存储器(MRAM)的方法
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Application No.: US13683783Application Date: 2012-11-21
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Publication No.: US08889431B2Publication Date: 2014-11-18
- Inventor: Xiaochun Zhu , Matthew Nowak , Xia Li , Seung H. Kang
- Applicant: QUALCOMM Incorporated
- Applicant Address: US CA San Diego
- Assignee: QUALCOMM Incorporated
- Current Assignee: QUALCOMM Incorporated
- Current Assignee Address: US CA San Diego
- Agent Donald D. Min
- Main IPC: H01L43/02
- IPC: H01L43/02 ; H01F10/32 ; G11C11/16 ; H01L27/22 ; H01L43/12

Abstract:
Magnetic tunnel junctions (MTJs) and methods of forming same are disclosed. A pinned layer is disposed in the MTJ such that a free layer of the MTJ can couple to a drain of an access transistor when provided in a magnetic random access memory (MRAM) bitcell. This structure alters the write current flow direction to align the write current characteristics of the MTJ with write current supply capability of an MRAM bitcell employing the MTJ. As a result, more write current can be provided to switch the MTJ from a parallel (P) to anti-parallel (AP) state. An anti-ferromagnetic material (AFM) layer is provided on the pinned layer to fix pinned layer magnetization. To provide enough area for depositing the AFM layer to secure pinned layer magnetization, a pinned layer having a pinned layer surface area greater than a free layer surface area of the free layer is provided.
Public/Granted literature
- US20130134533A1 MAGNETIC TUNNEL JUNCTION (MTJ) AND METHODS, AND MAGNETIC RANDOM ACCESS MEMORY (MRAM) EMPLOYING SAME Public/Granted day:2013-05-30
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