Invention Grant
- Patent Title: Apparatus and method for analyzing thermal properties of composite structures
- Patent Title (中): 用于分析复合结构热性能的装置和方法
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Application No.: US13236039Application Date: 2011-09-19
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Publication No.: US08878926B2Publication Date: 2014-11-04
- Inventor: Zheng John Ye , Kartik Ramaswamy , Troy S. Detrick , Kenneth S. Collins
- Applicant: Zheng John Ye , Kartik Ramaswamy , Troy S. Detrick , Kenneth S. Collins
- Applicant Address: US CA Santa Clara
- Assignee: Applied Materials, Inc.
- Current Assignee: Applied Materials, Inc.
- Current Assignee Address: US CA Santa Clara
- Agency: Patterson & Sheridan, LLP
- Main IPC: G01N25/72
- IPC: G01N25/72

Abstract:
Embodiments of the present invention provide methods and apparatus for analyzing thermal properties of bonding materials within a composite structure. One embodiment of the present invention provides an apparatus for analyzing thermal property of a bonding material within a structure. The apparatus comprises a structure support having a supporting surface configured to support the structure, a heat source configured to direct a heat flux to the structure supported by the supporting surface of the structure support, and a camera facing the structure supported on the structure support and configured to capture thermal images of the structure supported on the structure support.
Public/Granted literature
- US20120069174A1 APPARATUS AND METHOD FOR ANALYZING THERMAL PROPERTIES OF COMPOSITE STRUCTURES Public/Granted day:2012-03-22
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