Invention Grant
- Patent Title: Method of manufacturing semiconductor structure
- Patent Title (中): 制造半导体结构的方法
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Application No.: US13525568Application Date: 2012-06-18
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Publication No.: US08691688B2Publication Date: 2014-04-08
- Inventor: Hsin-Yu Chen , Yu-Han Tsai , Chun-Ling Lin , Ching-Li Yang , Home-Been Cheng
- Applicant: Hsin-Yu Chen , Yu-Han Tsai , Chun-Ling Lin , Ching-Li Yang , Home-Been Cheng
- Applicant Address: TW Hsinchu
- Assignee: United Microelectronics Corp.
- Current Assignee: United Microelectronics Corp.
- Current Assignee Address: TW Hsinchu
- Agency: WPAT, PC
- Agent Justin King
- Main IPC: H01L21/44
- IPC: H01L21/44

Abstract:
A method of processing a substrate is provided. The method includes: providing a substrate, wherein the substrate includes a silicon layer; etching the substrate to form a cavity; filling a first conductor in part of the cavity; performing a first thermal treatment on the first conductor; filling a second conductor in the cavity to fill-up the cavity; and performing a second thermal treatment on the first conductor and the second conductor.
Public/Granted literature
- US20130337645A1 METHOD OF MANUFACTURING SEMICONDUCTOR STRUCTURE Public/Granted day:2013-12-19
Information query
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