发明授权
- 专利标题: Parameter control in a lithographic apparatus using polarization
- 专利标题(中): 使用极化的光刻设备中的参数控制
-
申请号: US11353230申请日: 2006-02-14
-
公开(公告)号: US08675176B2公开(公告)日: 2014-03-18
- 发明人: Marinus Johanes Maria Van Dam , Wilhelmus Petrus De Boeij , Johannes Wilhelmus Wilhelmus De Klerk
- 申请人: Marinus Johanes Maria Van Dam , Wilhelmus Petrus De Boeij , Johannes Wilhelmus Wilhelmus De Klerk
- 申请人地址: NL Veldhoven
- 专利权人: ASML Netherlands B.V.
- 当前专利权人: ASML Netherlands B.V.
- 当前专利权人地址: NL Veldhoven
- 代理机构: Pillsbury Winthrop Shaw Pittman LLP
- 主分类号: G03B27/72
- IPC分类号: G03B27/72 ; G03B27/54 ; G03B27/32
摘要:
A lithographic apparatus includes an illuminator configured to provide a projection beam of radiation and a polarization controller configured to control an intensity of a preferred state of polarization of the projection beam. The lithographic apparatus further includes a support configured to hold a patterning device. The patterning device configured to pattern the projection beam according to a desired pattern. The apparatus also includes a substrate table configured to hold a substrate, and a projection system configured to project the patterned beam onto a target portion of the substrate to form a patterned image on the substrate.
公开/授权文献
信息查询