发明授权
US08675176B2 Parameter control in a lithographic apparatus using polarization 失效
使用极化的光刻设备中的参数控制

Parameter control in a lithographic apparatus using polarization
摘要:
A lithographic apparatus includes an illuminator configured to provide a projection beam of radiation and a polarization controller configured to control an intensity of a preferred state of polarization of the projection beam. The lithographic apparatus further includes a support configured to hold a patterning device. The patterning device configured to pattern the projection beam according to a desired pattern. The apparatus also includes a substrate table configured to hold a substrate, and a projection system configured to project the patterned beam onto a target portion of the substrate to form a patterned image on the substrate.
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