发明授权
- 专利标题: Particle sticking prevention apparatus and plasma processing apparatus
- 专利标题(中): 防尘装置和等离子体处理装置
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申请号: US10959197申请日: 2004-10-07
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公开(公告)号: US08608422B2公开(公告)日: 2013-12-17
- 发明人: Tsuyoshi Moriya , Hiroshi Nagaike , Teruyuki Hayashi , Kaoru Fujihara
- 申请人: Tsuyoshi Moriya , Hiroshi Nagaike , Teruyuki Hayashi , Kaoru Fujihara
- 申请人地址: JP Tokyo
- 专利权人: Tokyo Electron Limited
- 当前专利权人: Tokyo Electron Limited
- 当前专利权人地址: JP Tokyo
- 代理机构: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- 优先权: JP2003-349790 20031008; JP2003-349822 20031008
- 主分类号: H01L21/677
- IPC分类号: H01L21/677 ; H01L21/67 ; C23C16/00
摘要:
In order to prevent particles within a unit from sticking to a substrate in a substrate processing process, an ion generator charges the particles. At the same time, a direct current voltage of the same polarity as the charged polarity of the particles is applied from a direct current power source to the substrate. In order to prevent generation of particles when producing gas plasma, a high-frequency voltage is applied to the upper and lower electrodes at multiple stages to produce plasma. In other words, at a first step, a minimum high-frequency voltage at which plasma can be ignited is applied to the upper and lower electrodes, thereby producing a minimum plasma. Thereafter, the applied voltage is increased in stages to produce predetermined plasma.
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