Invention Grant
US08564347B2 Phase detector circuit for automatically detecting 270 and 540 degree phase shifts
有权
用于自动检测270度和540度相移的相位检测器电路
- Patent Title: Phase detector circuit for automatically detecting 270 and 540 degree phase shifts
- Patent Title (中): 用于自动检测270度和540度相移的相位检测器电路
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Application No.: US13607045Application Date: 2012-09-07
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Publication No.: US08564347B2Publication Date: 2013-10-22
- Inventor: Min Xu , Ming-Ju E. Lee
- Applicant: Min Xu , Ming-Ju E. Lee
- Applicant Address: US CA Sunnyvale
- Assignee: Advanced Micro Devices, Inc.
- Current Assignee: Advanced Micro Devices, Inc.
- Current Assignee Address: US CA Sunnyvale
- Agency: Volpe and Koenig, P.C.
- Main IPC: H03L7/06
- IPC: H03L7/06

Abstract:
Embodiments include implementing a phase detector for a delay-locked loop (DLL) circuit that is operable to detect substantially 270 degree and substantially 540 degree phase differences between two clock signals. In an embodiment, a DLL circuit comprises a delay line receiving a system clock signal and generating phase shifted clock signals, a phase detector receiving the system clock signal and phase shifted clock signal, and configured to generate corresponding up and down signals upon detection of a phase shift of substantially 270 degrees between the system clock signal and the phase shifted clock signal, a charge pump coupled to the phase detector, and configured to receive the up and down signals and generate a control signal responsive to thereto, and a regulator circuit to receive the control signal from the charge pump and generate a voltage control signal to the delay chain to control delay of the system clock signal.
Public/Granted literature
- US20130057328A1 PHASE DETECTOR CIRCUIT FOR AUTOMATICALLY DETECTING 270 AND 540 DEGREE PHASE SHIFTS Public/Granted day:2013-03-07
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