Invention Grant
- Patent Title: Nitride semiconductor template and fabricating method thereof
- Patent Title (中): 氮化物半导体模板及其制造方法
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Application No.: US12963650Application Date: 2010-12-09
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Publication No.: US08482103B2Publication Date: 2013-07-09
- Inventor: Hsun-Chih Liu , Chen-Zi Liao , Yen-Hsiang Fang , Rong Xuan , Chu-Li Chao
- Applicant: Hsun-Chih Liu , Chen-Zi Liao , Yen-Hsiang Fang , Rong Xuan , Chu-Li Chao
- Applicant Address: TW Hsinchu
- Assignee: Industrial Technology Research Institute
- Current Assignee: Industrial Technology Research Institute
- Current Assignee Address: TW Hsinchu
- Agency: Jianq Chyun IP Office
- Main IPC: H01L29/20
- IPC: H01L29/20

Abstract:
A nitride semiconductor template including a substrate, a mask layer, a first nitride semiconductor layer and a second nitride semiconductor is provided. The substrate has a plurality of trenches, each of the trenches has a bottom surface, a first inclined sidewall and a second inclined sidewall. The mask layer covers the second inclined sidewall and exposes the first inclined sidewall. The first nitride semiconductor layer is disposed over the substrate and the mask layer. The first nitride semiconductor layer fills the trenches and in contact with the first inclined sidewall. The first nitride semiconductor layer has voids located outside the trenches and parts of the mask layer are exposed by the voids. The first nitride semiconductor layer has a plurality of nano-rods. The second nitride semiconductor layer covers the nano-rods. The spaces between the nano-rods are not entirely filled by the second nitride semiconductor layer.
Public/Granted literature
- US20120146190A1 NITRIDE SEMICONDUCTOR TEMPLATE AND FABRICATING METHOD THEREOF Public/Granted day:2012-06-14
Information query
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