发明授权
US08270193B2 Local bit lines and methods of selecting the same to access memory elements in cross-point arrays
有权
本地位线及其选择方法可以访问交叉点阵列中的存储器元件
- 专利标题: Local bit lines and methods of selecting the same to access memory elements in cross-point arrays
- 专利标题(中): 本地位线及其选择方法可以访问交叉点阵列中的存储器元件
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申请号: US12657911申请日: 2010-01-29
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公开(公告)号: US08270193B2公开(公告)日: 2012-09-18
- 发明人: Chang Hua Siau , Christophe Chevallier , Darrell Rinerson , Seow Fong Lim , Sri Rama Namala
- 申请人: Chang Hua Siau , Christophe Chevallier , Darrell Rinerson , Seow Fong Lim , Sri Rama Namala
- 申请人地址: US CA Sunnyvale
- 专利权人: Unity Semiconductor Corporation
- 当前专利权人: Unity Semiconductor Corporation
- 当前专利权人地址: US CA Sunnyvale
- 代理机构: Stolowitz Ford Cowger LLP
- 主分类号: G11C5/02
- IPC分类号: G11C5/02
摘要:
Embodiments relate generally to semiconductors and memory technology, and more particularly, to systems, integrated circuits, and methods to implement a memory architecture that includes local bit lines for accessing subsets of memory elements, such as memory elements based on third dimensional memory technology. In at least some embodiments, an integrated circuit includes a cross-point memory array formed above a logic layer. The cross-point memory array includes X-lines and Y-lines, of which at least one Y-line includes groups of Y-line portions. Each of the Y-line portions can be arranged in parallel with other Y-line portions within a group of the Y-line portions. Also included are memory elements disposed between a subset of the X-lines and the group of the Y-line portions. In some embodiments, a decoder is configured to select a Y-line portion from the group of Y-line portions to access a subset of the memory elements.
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