发明授权
- 专利标题: Heat treatment apparatus and method for heating substrate by light irradiation
- 专利标题(中): 热处理装置及通过光照射加热基板的方法
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申请号: US12421896申请日: 2009-04-10
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公开(公告)号: US08145046B2公开(公告)日: 2012-03-27
- 发明人: Hiroki Kiyama , Kenichi Yokouchi
- 申请人: Hiroki Kiyama , Kenichi Yokouchi
- 申请人地址: JP
- 专利权人: Dainippon Screen Mfg. Co., Ltd.
- 当前专利权人: Dainippon Screen Mfg. Co., Ltd.
- 当前专利权人地址: JP
- 代理机构: Ostrolenk Faber LLP
- 优先权: JP2008-106894 20080416
- 主分类号: F26B3/30
- IPC分类号: F26B3/30 ; C33C16/00 ; A21B1/00
摘要:
In light-irradiation heating with a total irradiation time of one second or less, two-stage irradiation is performed, including a first stage of light irradiation of a semiconductor wafer, which irradiation produces an output waveform that reaches a peak at a given emission output; and a second stage of supplemental light irradiation of the semiconductor wafer, which irradiation is started after the peak, producing an emission output smaller than the above given emission output. The emission output in the second stage is two thirds or less than the above given emission output at the peak. The first-stage light-irradiation time is between 0.1 and 10 milliseconds, and the second-stage light-irradiation time is 5 milliseconds or more. This allows the temperature of the semiconductor wafer even at a somewhat greater depth below the surface to be raised to some extent while allowing the surface temperature to be maintained at a generally constant processing temperature.
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