Invention Grant
US07595675B2 Duty cycle measurement method and apparatus that operates in a calibration mode and a test mode
有权
在校准模式和测试模式下工作的占空比测量方法和装置
- Patent Title: Duty cycle measurement method and apparatus that operates in a calibration mode and a test mode
- Patent Title (中): 在校准模式和测试模式下工作的占空比测量方法和装置
-
Application No.: US11381031Application Date: 2006-05-01
-
Publication No.: US07595675B2Publication Date: 2009-09-29
- Inventor: David William Boerstler , Eskinder Hailu , Jieming Qi
- Applicant: David William Boerstler , Eskinder Hailu , Jieming Qi
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agent Matt Talpis; Mark P Kahler
- Main IPC: H03K5/04
- IPC: H03K5/04

Abstract:
The disclosed methodology and apparatus measure the duty cycle of a reference clock signal that a clock circuit supplies to a duty cycle measurement (DCM) circuit. In one embodiment, the DCM circuit includes a capacitor driven by a charge pump. The reference clock signal drives the charge pump. The clock circuit varies the duty cycle of the reference clock signal among a number of known duty cycle values. The DCM circuit stores resultant capacitor voltage values corresponding to each of the known duty cycle values in a data store. The DCM circuit applies a test clock signal having an unknown duty cycle to the capacitor via the charge pump, thus charging the capacitor to a new voltage value that corresponds to the duty cycle of the test clock signal. Control software accesses the data store to determine the duty cycle to which the test clock signal corresponds.
Public/Granted literature
- US20070266285A1 DUTY CYCLE MEASUREMENT METHOD AND APPARATUS THAT OPERATES IN A CALIBRATION MODE AND A TEST MODE Public/Granted day:2007-11-15
Information query
IPC分类: