发明授权
US07349243B2 3-parameter switching technique for use in MRAM memory arrays 有权
用于MRAM存储器阵列的3参数切换技术

3-parameter switching technique for use in MRAM memory arrays
摘要:
Disclosed herein are various embodiments of a 3-parameter switching technique for MRAM memory cells arranged on an MRAM array. The disclosed technique alters the relationship between the disturbance margin and write margin of MRAM arrays to reduce the overall disturbance for the arrays by either enlarging the write margin with respect to the original disturbance margin or enlarging the disturbance margin in view of the original write margin. In either approach, the disclosed 3-parameter switching technique successfully decreases the inadvertent writing of unselected bits.
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