发明授权
- 专利标题: 3-parameter switching technique for use in MRAM memory arrays
- 专利标题(中): 用于MRAM存储器阵列的3参数切换技术
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申请号: US11379527申请日: 2006-04-20
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公开(公告)号: US07349243B2公开(公告)日: 2008-03-25
- 发明人: Wen-Chin Lin , Denny Tang , Hsu-Chen Cheng
- 申请人: Wen-Chin Lin , Denny Tang , Hsu-Chen Cheng
- 申请人地址: TW Hsinchu
- 专利权人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 当前专利权人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 当前专利权人地址: TW Hsinchu
- 代理机构: Baker & McKenzie LLP
- 主分类号: G11C11/00
- IPC分类号: G11C11/00
摘要:
Disclosed herein are various embodiments of a 3-parameter switching technique for MRAM memory cells arranged on an MRAM array. The disclosed technique alters the relationship between the disturbance margin and write margin of MRAM arrays to reduce the overall disturbance for the arrays by either enlarging the write margin with respect to the original disturbance margin or enlarging the disturbance margin in view of the original write margin. In either approach, the disclosed 3-parameter switching technique successfully decreases the inadvertent writing of unselected bits.
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