Invention Grant
- Patent Title: Fault detection and classification (FDC) specification management apparatus and method thereof
- Patent Title (中): 故障检测和分类（FDC）规范管理装置及其方法
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Application No.: US10947092Application Date: 2004-09-22
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Publication No.: US07254513B2Publication Date: 2007-08-07
- Inventor: Mu-Tsang Lin , Yi-Yu Wu , Chia-Hung Chung , Jian-Hong Chen , Chon-Hwa Chu , Ie-Fun Lai , Wen-Sheng Chien
- Applicant: Mu-Tsang Lin , Yi-Yu Wu , Chia-Hung Chung , Jian-Hong Chen , Chon-Hwa Chu , Ie-Fun Lai , Wen-Sheng Chien
- Applicant Address: TW Hsin-Chu
- Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee Address: TW Hsin-Chu
- Agency: Thomas, Kayden, Horstemeyer & Risley
- Main IPC: G06F15/00
- IPC: G06F15/00 ; G06F19/00
Abstract:
An apparatus for fault detection and classification (FDC) specification management including a storage device and a process module. The storage device stores a specification management record and a chart profile record. The specification management record stores statistical algorithm settings of a parameter and the chart profile record stores chart frame and alarm condition information. The process module, which resides in a memory, receives a manipulation message corresponding to the specification management record, and accordingly manipulates the chart profile record.
Public/Granted literature
- US20060075314A1 Fault detection and classification (FDC) specification management apparatus and method thereof Public/Granted day:2006-04-06
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