Invention Grant
US07142622B1 Multiplying phase detector for use in a random data locked loop architecture 有权
乘法相位检测器用于随机数据锁定环路架构

  • Patent Title: Multiplying phase detector for use in a random data locked loop architecture
  • Patent Title (中): 乘法相位检测器用于随机数据锁定环路架构
  • Application No.: US10421248
    Application Date: 2003-04-22
  • Publication No.: US07142622B1
    Publication Date: 2006-11-28
  • Inventor: Brian T. BrunnAhmed Younis
  • Applicant: Brian T. BrunnAhmed Younis
  • Applicant Address: US CA San Jose
  • Assignee: XILINX, Inc.
  • Current Assignee: XILINX, Inc.
  • Current Assignee Address: US CA San Jose
  • Agent Timothy Markison
  • Main IPC: H03D3/24
  • IPC: H03D3/24
Multiplying phase detector for use in a random data locked loop architecture
Abstract:
A multiplying phase detector includes a 1st multiplier, a 2nd multiplier and a phase error generation module. The 1st multiplier is operably coupled to multiple an incoming data stream, which is a random data pattern, with a 1st clock, which is in-phase with the incoming stream of data and is one-half the rate of the incoming stream of data, to produce a 1st product. In this instance, the 1st product represents missing transitions in the incoming stream of data. The 2nd multiplier is operably coupled to multiply the 1st product with the incoming data stream to produce a modified stream of data. The phase error generation module is operably coupled to generate a phase error based on the modified stream of data and a 2nd clock, where the phase error represents a phase offset between the modified stream of data and the 2nd clock.
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