Invention Grant
- Patent Title: Electron beam sensor
- Patent Title (中): 电子束传感器
-
Application No.: US10326923Application Date: 2002-12-19
-
Publication No.: US06919570B2Publication Date: 2005-07-19
- Inventor: Tzvi Avnery
- Applicant: Tzvi Avnery
- Applicant Address: US MA Wilmington
- Assignee: Advanced Electron Beams, Inc.
- Current Assignee: Advanced Electron Beams, Inc.
- Current Assignee Address: US MA Wilmington
- Agency: Hamilton, Brook, Smith & Reynolds, P.C.
- Main IPC: H01J37/244
- IPC: H01J37/244 ; H01J33/04

Abstract:
A sensing device for sensing an electron beam includes a vacuum chamber having an electron permeable window for allowing electrons from the electron beam to enter vacuum chamber. An electrode extends within the vacuum chamber for receiving at least a portion of the electrons entering the vacuum chamber. The intensity of the electron beam is capable of being determined from the amount of electrons received by the electrode.
Public/Granted literature
- US20040119024A1 Electron beam sensor Public/Granted day:2004-06-24
Information query