发明授权
US5719429A High frequency/high output insulated gate semiconductor device with
reduced and balanced gate resistance
失效
具有降低和平衡栅极电阻的高频/高输出绝缘栅极半导体器件
- 专利标题: High frequency/high output insulated gate semiconductor device with reduced and balanced gate resistance
- 专利标题(中): 具有降低和平衡栅极电阻的高频/高输出绝缘栅极半导体器件
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申请号: US579288申请日: 1995-12-27
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公开(公告)号: US5719429A公开(公告)日: 1998-02-17
- 发明人: Isao Yoshida , Mineo Katsueda , Yasuo Maruyama
- 申请人: Isao Yoshida , Mineo Katsueda , Yasuo Maruyama
- 申请人地址: JPX Tokyo
- 专利权人: Hitachi, Ltd.
- 当前专利权人: Hitachi, Ltd.
- 当前专利权人地址: JPX Tokyo
- 优先权: JPX6-326010 19941227
- 主分类号: H01L29/78
- IPC分类号: H01L29/78 ; H01L29/423 ; H01L29/45 ; H01L29/49 ; H01L29/76 ; H01L29/94
摘要:
An insulated gate semiconductor device, which improves high frequency characteristics by reducing the resistance of a path from a gate bonding portion to each gate and eliminating an unbalance in resistances of respective gates, and which obtain a higher output by eliminating a limitation in current capacity due to the thickness of a first metal layer. In this insulated gate semiconductor device, a first aluminum layer is connected in parallel onto a gate electrode made of polycrystalline silicon. The adjacent gates, each having such a double layer structure, extend outside channel regions and are connected to each other. A lead-out electrode of a second aluminum layer is connected to the center of the connection portion of the adjacent gates through an opening portion. A gate bonding portion is provided at the center of the lead-out electrode. Each of source and drain electrodes is also of a double layer structure having the first aluminum layer and the second aluminum layer.
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