发明授权
US5191235A Semiconductor integrated circuit device having substrate potential
detection circuit
失效
具有基板电位检测电路的半导体集成电路装置
- 专利标题： Semiconductor integrated circuit device having substrate potential detection circuit
- 专利标题（中）： 具有基板电位检测电路的半导体集成电路装置
-
申请号： US827000申请日： 1992-01-28
-
公开(公告)号： US5191235A公开(公告)日： 1993-03-02
- 发明人: Takahiro Hara
- 申请人： Takahiro Hara
- 申请人地址： JPX Tokyo
- 专利权人： NEC Corporation
- 当前专利权人： NEC Corporation
- 当前专利权人地址： JPX Tokyo
- 优先权： JPX3-28077 19910129
- 主分类号： G11C11/407
- IPC分类号： G11C11/407 ; G11C11/408 ; G11C11/413 ; H01L21/822 ; H01L27/02 ; H01L27/04 ; H01L27/10 ; H03F1/30
摘要：
A node potential V1 which is obtained by the division of an internal reference potential and a substrate potential and another node potential V2 which is obtained by the division of the internal reference potential and the ground potential are compared with each other by a current-mirror amplifier. The initial setting of the above two node potentials (V1 and V2) is made as V1>V2. When the substrate potential becomes large in its absolute value, the node potential V1 falls following such change and, when it reaches a predetermined substrate potential, the potentials result in V1
公开/授权文献
- US5787535A Chain saw multi-tool 公开/授权日：1998-08-04
信息查询
IPC分类:
