Invention Grant
- Patent Title: Complementary semiconductor device reducing latch-up phenomenon
- Patent Title (中): 互补半导体器件减少闭锁现象
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Application No.: US266332Application Date: 1988-11-01
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Publication No.: US4862415APublication Date: 1989-08-29
- Inventor: Tomio Nakano
- Applicant: Tomio Nakano
- Applicant Address: JPX Kawasaki
- Assignee: Fujitsu Limited
- Current Assignee: Fujitsu Limited
- Current Assignee Address: JPX Kawasaki
- Priority: JPX60-178958 19850814
- Main IPC: G11C11/00
- IPC: G11C11/00 ; G05F3/20 ; G11C5/14 ; G11C8/10 ; G11C11/405 ; G11C11/407 ; G11C11/413 ; H01L27/00
Abstract:
A semiconductor device has a substrate of a first conductivity type including a well of a second conductivity type opposite to the first conductivity type. The semiconductor device comprises a bias potential generating circuit for generating a potential in the substrate or the well; a potential detecting circuit for detecting a potential of the substrate or the well and a gate circuit. The gate circuit is connected to the potential detecting circuit and to an internal circuit and applies an enable signal to the internal circuit in accordance with the detected potential of the substrate or the well. Consequently, latch-up of parasitic transistors in a CMIS-inverter circuit of the semiconductor device can be prevented.
Public/Granted literature
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