发明授权
US4805123A Automatic photomask and reticle inspection method and apparatus
including improved defect detector and alignment sub-systems
失效
自动光掩模和掩模版检查方法和设备,包括改进的缺陷检测器和对准子系统
- 专利标题: Automatic photomask and reticle inspection method and apparatus including improved defect detector and alignment sub-systems
- 专利标题(中): 自动光掩模和掩模版检查方法和设备,包括改进的缺陷检测器和对准子系统
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申请号: US885197申请日: 1986-07-14
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公开(公告)号: US4805123A公开(公告)日: 1989-02-14
- 发明人: Donald F. Specht , Tim S. Wihl , Scott A. Young , James J. Hager, Jr. , Matthew B. Lutzker
- 申请人: Donald F. Specht , Tim S. Wihl , Scott A. Young , James J. Hager, Jr. , Matthew B. Lutzker
- 申请人地址: CA Santa Clara
- 专利权人: KLA Instruments Corporation
- 当前专利权人: KLA Instruments Corporation
- 当前专利权人地址: CA Santa Clara
- 主分类号: H01L21/66
- IPC分类号: H01L21/66 ; G01B11/00 ; G01N21/88 ; G01N21/956 ; G03F1/08 ; G06T1/00 ; G06T7/00 ; H01L21/027 ; H01L21/30 ; G06K9/68 ; G06K9/38
摘要:
A photomask and reticle inspection method and apparatus wherein a selected surface area of an object is inspected and a first stream of data having signal values representing the image content of each pixel thereof is generated, a second stream of data having signal values representing the intended image content of each pixel of the first stream of data is generated, corresponding portions of the first and second streams of data are stored in memory, any misalignment between the stored portions of the first and second streams of data is detected, the misaligned first and second portions of data are then aligned using shifts of an integral number of pixels and/or subpixel interpolation to correct the detected misalignment therebetween, corresponding subportions of the stored and aligned first and second portions of data are then compared to detect difference therebetween, and upon detecting a difference exceeding a predetermined threshold, the presence of a defect at a particular pixel location on the inspected object is indicated.
公开/授权文献
- US5848806A Steering wheel 公开/授权日:1998-12-15
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