发明授权
- 专利标题: Graded gap semiconductor detector
- 专利标题(中): 分级间隙半导体检测器
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申请号: US143694申请日: 1980-04-25
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公开(公告)号: US4263604A公开(公告)日: 1981-04-21
- 发明人: James D. Jensen , Richard B. Schoolar
- 申请人: James D. Jensen , Richard B. Schoolar
- 申请人地址: DC Washington
- 专利权人: The United States of America as represented by the Secretary of the Navy
- 当前专利权人: The United States of America as represented by the Secretary of the Navy
- 当前专利权人地址: DC Washington
- 主分类号: C30B23/00
- IPC分类号: C30B23/00 ; C30B23/04 ; H01L31/032 ; H01L31/065 ; H01L27/14
摘要:
A variable temperature method for the preparation of single and multiple taxial layers of single-phase (e.g., face-centered cubic), ternary lead chalcogenide alloys (e.g., lead cadmium sulfide, [Pb.sub.1-w Cd.sub.w ].sub.a [S].sub.1-a where w varies between zero and fifteen hundredths, inclusive, and a=0.500.+-.0.003), deposited upon substrates of barium fluoride, BaF.sub.2, maintained in near thermodynamic equilibrium with concurrently sublimated lead alloy and chalcogenide sources. During preparation, the temperature of the substrate is varied, thereby providing an epilayer with graded composition and predetermined electrical and optical properties along the direction of growth. This growth technique can be used to produce infrared lenses, narrowband detectors, and double heterojunction lasers.
公开/授权文献
- US6162083A Electrical connector system for flat circuitry 公开/授权日:2000-12-19
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