- 专利标题: STACKED SEMICONDUCTOR DEVICE AND METHOD
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申请号: US18763542申请日: 2024-07-03
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公开(公告)号: US20240355815A1公开(公告)日: 2024-10-24
- 发明人: Min-Feng Kao , Dun-Nian Yaung , Jen-Cheng Liu , Hsing-Chih Lin
- 申请人: Taiwan Semiconductor Manufacturing Co., Ltd.
- 申请人地址: TW Hsinchu
- 专利权人: Taiwan Semiconductor Manufacturing Co., Ltd.
- 当前专利权人: Taiwan Semiconductor Manufacturing Co., Ltd.
- 当前专利权人地址: TW Hsinchu
- 分案原申请号: US17371660 2021.07.09
- 主分类号: H01L27/06
- IPC分类号: H01L27/06 ; H01L21/265 ; H01L23/00 ; H01L23/522 ; H01L29/66 ; H01L29/861
摘要:
A semiconductor device and a method of forming the same are provided. The semiconductor device includes a first substrate, a capacitor within the first substrate, a diode structure within the first substrate adjacent the capacitor, and a first interconnect structure over the capacitor and the diode structure. A first conductive via of the first interconnect structure electrically couples the capacitor to the diode structure.
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