- 专利标题: SUBSTRATE(S) FOR AN INTEGRATED CIRCUIT (IC) PACKAGE EMPLOYING A METAL CORE FOR IMPROVED ELECTRICAL SHIELDING AND STRUCTURAL STRENGTH, AND RELATED IC PACKAGES AND FABRICATION METHODS
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申请号: US18303072申请日: 2023-04-19
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公开(公告)号: US20240355712A1公开(公告)日: 2024-10-24
- 发明人: Michelle Yejin Kim , Hong Bok We , Joan Rey Villarba Buot , Kuiwon Kang
- 申请人: QUALCOMM Incorporated
- 申请人地址: US CA San Diego
- 专利权人: QUALCOMM Incorporated
- 当前专利权人: QUALCOMM Incorporated
- 当前专利权人地址: US CA San Diego
- 主分类号: H01L23/488
- IPC分类号: H01L23/488 ; H01L21/48 ; H01L23/14
摘要:
A substrate(s) for an integrated circuit (IC) package employing a metal core for improved electrical shielding and structural strength. In one aspect, a substrate comprises a core layer. The core layer comprises a metal core, the metal core having a first surface and a second surface opposite the first surface. The core layer further comprises a first insulation layer on the first surface and a second insulation layer on the second surface. The substrate further comprises a first metallization structure adjacent to the first insulation layer and a second metallization structure adjacent to the second insulation layer. The metal core provides electrical shielding of signals/power routed through the metal core for noise coupling reduction allowing a higher density of signal and power paths to be supported in substrate, while also strengthening structural integrity to prevent or reduce warpage in the IC package.
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